Deep-level analysis in (AlGa)As—GaAs 2-D electron gas devices by means of low-frequency noise measurements
Keyword(s):
Low frequency noise measurements as a tool to analyze deep-level impurities in semiconductor devices
1987 ◽
Vol 30
(3)
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pp. 259-265
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1991 ◽
Vol 40
(1)
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pp. 2-6
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2007 ◽
Vol 47
(9-11)
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pp. 1456-1461
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2018 ◽
Vol 1015
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pp. 052011
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2015 ◽
Vol 14
(5-6)
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pp. 909-915
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2003 ◽
Vol 433-436
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pp. 677-680
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