Electrical characterization of transparent organic conducting thin films preventing mechanical damage and preserving optical transparency

Optical Transparency

Vapor Deposition Polymerization and Electrical Characterization of TPD Thin Films

IEICE Transactions on Electronics ◽

10.1587/transele.e94.c.157 ◽

2011 ◽

Vol E94-C (2) ◽

pp. 157-163 ◽

Cited By ~ 4

Author(s):

Masakazu MUROYAMA ◽

Ayako TAJIRI ◽

Kyoko ICHIDA ◽

Seiji YOKOKURA ◽

Kuniaki TANAKA ◽

...

Keyword(s):

Thin Films ◽

Vapor Deposition ◽

Electrical characterization of silicon dioxide and silicon oxynitride thin films

10.31979/etd.dunk-3588 ◽

2006 ◽

Author(s):

April Tai

Keyword(s):

Thin Films ◽

Silicon Dioxide ◽

Silicon Oxynitride

Structure, optical, and electrical characterization of nanostructured gallium sulfide Ga2S3 thin films for electronic and solar cell applications

Journal of Materials Science Materials in Electronics ◽

10.1007/s10854-021-05288-9 ◽

2021 ◽

Author(s):

A. Abdel Moez

Keyword(s):

Thin Films ◽

Solar Cell ◽

Gallium Sulfide

2010 7th International Conference on Electrical Engineering Computing Science and Automatic Control ◽

Electrical characterization of Pd-PdO nanocomposites and PdO thin films prepared by thermal oxidation of Pd

10.1109/iceee.2010.5608620 ◽

2010 ◽

Author(s):

O. Garcia-Serrano ◽

R. Pena-Sierra ◽

G. Romero-Paredes

Keyword(s):

Thin Films ◽

Thermal Oxidation ◽

ISAF '96. Proceedings of the Tenth IEEE International Symposium on Applications of Ferroelectrics ◽

Electrical characterization of MOCVD grown epitaxial and polycrystalline PLT thin films

10.1109/isaf.1996.602762 ◽

2002 ◽

Author(s):

A. Kushwaha ◽

R.A. Gerhardt ◽

Y. Kim ◽

A. Erbril

Keyword(s):

Thin Films ◽

Electrical Characterization of Thin Films Using Measurements of Electrical Resistivity

Electronics, Robotics and Automotive Mechanics Conference (CERMA'06) ◽

10.1109/cerma.2006.41 ◽

2006 ◽

Author(s):

J. Vanegasa A. ◽

O. Molina G.

Keyword(s):

Thin Films ◽

Electrical Resistivity ◽

Low Temperature Formation of SiO2 Thin Films by Nitric Acid Oxidation of Si and Electrical Characterization of the Film

Hyomen Kagaku ◽

10.1380/jsssj.29.498 ◽

2008 ◽

Vol 29 (8) ◽

pp. 498-502 ◽

Cited By ~ 1

Author(s):

Taketoshi MATSUMOTO ◽

Kentaro IMAMURA ◽

Hikaru KOBAYASHI

Keyword(s):

Thin Films ◽

Nitric Acid ◽

Low Temperature ◽

Acid Oxidation ◽

Nitric Acid Oxidation

Proceedings of 1994 IEEE 1st World Conference on Photovoltaic Energy Conversion - WCPEC (A Joint Conference of PVSC, PVSEC and PSEC) ◽

Optical and electrical characterization of chemically deposited cadmium sulfide thin films

10.1109/wcpec.1994.519874 ◽

2002 ◽

Cited By ~ 3

Author(s):

M.E. Ozsan ◽

D.R. Johnson ◽

M. Sadeghi ◽

D. Sivapathasundaram ◽

L.M. Peter ◽

...

Keyword(s):

Thin Films ◽

Cadmium Sulfide ◽

Structural and electrical characterization of AIN thin films obtained by nitridation of Al/Si substrate

Journal of Electronic Materials ◽

10.1007/s11664-999-0018-x ◽

1999 ◽

Vol 28 (3) ◽

pp. 225-227 ◽

Cited By ~ 7

Author(s):

Jipo Huang ◽

Lianwei Wang ◽

Qinwo Shen ◽

Chenglu Lin ◽

Mikael Östling

Keyword(s):

Thin Films ◽

Si Substrate

Structural, morphological and electrical characterization of ceria-based nanostructured thin films obtained by ultrasonic spray pyrolysis

Boletín de la Sociedad Española de Cerámica y Vidrio ◽

10.1016/j.bsecv.2018.06.004 ◽

2019 ◽

Vol 58 (1) ◽

pp. 38-47 ◽

Cited By ~ 2

Author(s):

Rubén Martínez-Bautista ◽

Suilma M. Fernández-Valverde ◽

Adriana Tejeda-Cruz ◽

José A. Chávez-Carvayar

Keyword(s):

Thin Films ◽

Spray Pyrolysis ◽

Ultrasonic Spray Pyrolysis ◽

Nanostructured Thin Films ◽

Ultrasonic Spray