Large-Signal modeling of power GaN HEMTs including thermal effects

Author(s):  
German Torregrosa ◽  
Jesus Grajal ◽  
Marco Peroni ◽  
Antonio Serino ◽  
Antonio Nanni ◽  
...  
Author(s):  
Anwar Jarndal ◽  
Pouya Aflaki ◽  
Louay Degachi ◽  
Ahmed Birafane ◽  
Ammar Kouki ◽  
...  

Author(s):  
I. Angelov ◽  
M. Thorsell ◽  
K. Andersson ◽  
N. Rorsman ◽  
E. Kuwata ◽  
...  

2017 ◽  
Vol 65 (7) ◽  
pp. 2271-2278 ◽  
Author(s):  
Xiaodong Zhao ◽  
Yuehang Xu ◽  
Yonghao Jia ◽  
Yunqiu Wu ◽  
Ruimin Xu ◽  
...  

Author(s):  
Anwar Jarndal ◽  
Saddam Husain ◽  
Mohammad Hashmi ◽  
Fadhel M. Ghannouchi

Author(s):  
J. Alberto Zamudio-Flores ◽  
Samir Dahmani ◽  
Günter Kompa

This work presents a measurement-based physics-oriented large-signal modeling technique for GaN HEMTs. All the model elements are derived directly from pulsed-DC measurements and bias dependent small-signal model elements. The proposed small-signal model features a 12-element extrinsic network, which allows proper modeling of the complex parasitic effects present in large gate-width devices. A reliable generally applicable extrinsic extraction algorithm is presented. It is based on pinch-off S-parameter measurements and on a scanning procedure to find the optimal capacitance distribution. Results of applying the algorithm with measured data of a GaN HEMT with gate width of 3.2-mm prove the consistency of the formulation. Successful model verification is shown under pulsed-DC, single- and two-tone operations, showing accurate predictions versus measurements of IDS, Pout, gain, harmonics and IMD products.


Author(s):  
Anwar Jarndal ◽  
Pouya Aflaki ◽  
Renato Negra ◽  
Ammar B. Kouki ◽  
Fadhel M. Ghannouchi

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