Security Assessment and Reliability Improvement with considering Demand Response

Author(s):  
Farhad Amin ◽  
Mohammad Mahdi Borhan Elmi
2012 ◽  
Vol 96 ◽  
pp. 104-114 ◽  
Author(s):  
D. Wang ◽  
S. Parkinson ◽  
W. Miao ◽  
H. Jia ◽  
C. Crawford ◽  
...  

2009 ◽  
Vol 129 (10) ◽  
pp. 949-956
Author(s):  
Kohji Ajiki ◽  
Hiroaki Morimoto ◽  
Fumiyuki Shimokawa ◽  
Shinya Sakai ◽  
Kazuomi Sasaki ◽  
...  

2017 ◽  
Vol 137 (5) ◽  
pp. 372-380 ◽  
Author(s):  
Yutaka Iino ◽  
Tsutomu Fujikawa ◽  
Saori Kaneko ◽  
Gaku Shimoda ◽  
Kazuto Kataoka ◽  
...  
Keyword(s):  

Author(s):  
Michael Hertl ◽  
Diane Weidmann ◽  
Alex Ngai

Abstract A new approach to reliability improvement and failure analysis on ICs is introduced, involving a specifically developed tool for Topography and Deformation Measurement (TDM) under thermal stress conditions. Applications are presented including delamination risk or bad solderability assessment on BGAs during JEDEC type reflow cycles.


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