Ultrasonic flaw detection using sparse representation for failure analysis of next generation microelectronic packages

Author(s):  
Guangming Zhang ◽  
D.M. Harvey ◽  
D.R. Braden
2019 ◽  
Vol 102 ◽  
pp. 199-206 ◽  
Author(s):  
Yingdong Fu ◽  
Ping Hu ◽  
Joseph A. Turner ◽  
Yongfeng Song ◽  
Xiongbing Li

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