Sensor Placement for Contamination Source Detection in Water Channel Networks

Author(s):  
Supriya Das ◽  
Siba K Udgata
2020 ◽  
Vol 56 (90) ◽  
pp. 14059-14062
Author(s):  
Heelim Lee ◽  
DoGyun Kim ◽  
Hyunji Ma ◽  
Kyoung Taek Kim

The interfacial topology of block copolymer cubic mesophases opens only one of two internal water channel networks for diffusion.


Author(s):  
Alexander Khapalov

Source localization and sensor placement in environmental monitoringIn this paper we discuss two closely related problems arising in environmental monitoring. The first is the source localization problem linked to the questionHow can one find an unknown "contamination source"?The second is an associated sensor placement problem:Where should we place sensors that are capable of providing the necessary "adequate data" for that?Our approach is based on some concepts and ideas developed in mathematical control theory of partial differential equations.


2009 ◽  
Vol 150 (46) ◽  
pp. 2101-2109 ◽  
Author(s):  
Péter Csécsei ◽  
Anita Trauninger ◽  
Sámuel Komoly ◽  
Zsolt Illés

The identification of autoantibodies generated against the brain isoform water channel aquaporin4 in the sera of patients, changed the current diagnostic guidelines and concept of neuromyelitis optica (NMO). In a number of cases, clinical manifestation is spatially limited to myelitis or relapsing optic neuritis creating a diverse. NMO spectrum. Since prevention of relapses provides the only possibility to reduce permanent disability, early diagnosis and treatment is mandatory. In the present study, we discuss the potential role of neuroimaging and laboratory tests in differentiating the NMO spectrum from other diseases, as well as the diagnostic procedures and therapeutic options. We also present clinical cases, to provide examples of different clinical settings, diagnostic procedures and therapeutic decisions.


2021 ◽  
Author(s):  
Adam Augustyniak ◽  
David J. Hanley ◽  
Timothy W. Bretl ◽  
Neil J. Hejmanowski ◽  
David L. Carroll

Author(s):  
Victor K. F. Chia ◽  
Hugh E. Gotts ◽  
Fuhe Li ◽  
Mark Camenzind

Abstract Semiconductor devices are sensitive to contamination that can cause product defects and product rejects. There are many possible types and sources of contamination. Root cause resolution of the contamination source can improve yield. The purpose of contamination troubleshooting is to identify and eliminate major yield limiters. This requires the use of a variety of analytical techniques[1]. Most important, it requires an understanding of the principle of contamination troubleshooting and general knowledge of analytical tests. This paper describes a contamination troubleshooting approach with case studies as examples of its application.


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