Contamination Troubleshooting Approach from Problem to Solution

Author(s):  
Victor K. F. Chia ◽  
Hugh E. Gotts ◽  
Fuhe Li ◽  
Mark Camenzind

Abstract Semiconductor devices are sensitive to contamination that can cause product defects and product rejects. There are many possible types and sources of contamination. Root cause resolution of the contamination source can improve yield. The purpose of contamination troubleshooting is to identify and eliminate major yield limiters. This requires the use of a variety of analytical techniques[1]. Most important, it requires an understanding of the principle of contamination troubleshooting and general knowledge of analytical tests. This paper describes a contamination troubleshooting approach with case studies as examples of its application.

Author(s):  
Sukho Lee ◽  
John van den Biggelaar ◽  
Marc van Veenhuizen

Abstract Laser-based dynamic analysis has become a very important tool for analyzing advanced process technology and complex circuit design. Thus, many good reference papers discuss high resolution, high sensitivity, and useful applications. However, proper interpretation of the measurement is important as well to understand the failure behavior and find the root cause. This paper demonstrates this importance by describing two insightful case studies with unique observations from laser voltage imaging/laser voltage probing (LVP), optical beam induced resistance change, and soft defect localization (SDL) analysis, which required an in-depth interpretation of the failure analysis (FA) results. The first case is a sawtooth LVP signal induced by a metal short. The second case, a mismatched result between an LVP and SDL analysis, is a good case of unusual LVP data induced by a very sensitive response to laser light. The two cases provide a good reference on how to properly explain FA results.


Author(s):  
Erik Paul ◽  
Holger Herzog ◽  
Sören Jansen ◽  
Christian Hobert ◽  
Eckhard Langer

Abstract This paper presents an effective device-level failure analysis (FA) method which uses a high-resolution low-kV Scanning Electron Microscope (SEM) in combination with an integrated state-of-the-art nanomanipulator to locate and characterize single defects in failing CMOS devices. The presented case studies utilize several FA-techniques in combination with SEM-based nanoprobing for nanometer node technologies and demonstrate how these methods are used to investigate the root cause of IC device failures. The methodology represents a highly-efficient physical failure analysis flow for 28nm and larger technology nodes.


2021 ◽  
Vol 72 (3) ◽  
pp. 223
Author(s):  
Wesley M. Moss ◽  
Andrew L. Guzzomi ◽  
Kevin J. Foster ◽  
Megan H. Ryan ◽  
Phillip G. H. Nichols

Subterranean clover (Trifolium subterraneum L.) is Australia’s most widely sown annual pasture legume. Its widespread use as a pasture plant requires a well-functioning seed production industry, and Australia is the only significant producer of subterranean clover seed globally. However, the sustainability of this industry is under threat due to its reliance on ageing harvest equipment and the resultant environmental impacts. In order to evaluate seed harvesting practices, technology, and issues, we report on case studies, workshops, and a survey of seed producers across southern Australia. The Horwood Bagshaw Clover Harvester, designed in the 1950s, remains the most popular subterranean clover seed harvester. We discuss its use and modifications, and document several contemporary issues facing the seed production industry. Issues are primarily soil erosion and degradation; the expensive, slow and labour-intensive harvest process; and poor reliability and maintainability of harvesters that are now at least 30 years old. We conclude the root cause of these issues is the suction harvest technology utilised by the Horwood Bagshaw Clover Harvester. Analysis of the current harvest system is provided to support the development of new approaches to harvest subterranean clover seeds.


Author(s):  
John J. Yu

Vibration excursion in turbomachinery is troublesome, especially when approaching or exceeding a trip level. Understanding of its root-cause is extremely crucial for taking appropriate actions and resolving the issue. Rubs are certainly among the most common malfunctions that cause vibration excursion. This paper discusses how to diagnose rubs that typically occur in turbomachinery based on vibration data. These include rubs occurring in both steady-state and transient conditions. Selection and interpretation of vibration data plots such as trend, polar, Bode, orbit, and waterfall are illustrated that pinpoint rubbing and resulted shaft bow symptoms. All data presented have been obtained from real machines where rubs occurred. Mainly case studies are presented in this paper. The presented cases and concluded diagnostic rules using vibration data plots will help practicing engineers as well as enhance diagnostic tools.


2019 ◽  
Vol 29 (6) ◽  
pp. 745-755 ◽  
Author(s):  
Jennifer L. Parke ◽  
Neelam R. Redekar ◽  
Joyce L. Eberhart ◽  
Fumiaki Funahashi

Phytophthora species cause crop losses and reduce the quality of greenhouse and nursery plants. Phytophthora species can also be moved long distances by the plant trade, potentially spreading diseases to new hosts and habitats. Phytosanitary approaches based on quarantines and endpoint inspections have reduced, but not eliminated, the spread of Phytophthora species from nurseries. It is therefore important for plant production facilities to identify potential sources of contamination and to take corrective measures to prevent disease. We applied a systems approach to identify sources of contamination in three container nurseries in Oregon, California, and South Carolina. Surface water sources and recaptured runoff water were contaminated with plant pathogenic species at all three nurseries, but one nursery implemented an effective disinfestation treatment for recycled irrigation water. Other sources of contamination included cull piles and compost that were incorporated into potting media, infested soil and gravel beds, used containers, and plant returns. Management recommendations include preventing contact between containers and contaminated ground, improving drainage, pasteurizing potting media ingredients, steaming used containers, and quarantine and testing of incoming plants for Phytophthora species. These case studies illustrate how recycled irrigation water can contribute to the spread of waterborne pathogens and highlight the need to implement nursery management practices to reduce disease risk.


2021 ◽  
Author(s):  
Joseph Greto

In today’s society, concrete structures are deteriorating for a variety of reasons. In order to properly repair these structures, it is important to completely understand the root cause of each type of deterioration. Over the years, engineers have developed methods for identifying the causes of concrete failure. This paper recognizes the different forms of concrete deterioration, identifies the test methods which have been developed to locate these concrete defects (both non-destructive and destructive), reviews different case studies which have been performed on concrete parking structures implementing these test methods and draws conclusions from surveys which were conducted of professionals in the rehabilitation engineering field. Additionally, this research project develops a strategy which is meant to aid with the selection of concrete test methods to be used in diverse concrete deterioration situations.


Author(s):  
James B. Riddle

Abstract This paper will examine semiconductor wear out at San Onofre Nuclear Generation Station (SONGS). The topics will include case studies, failure mechanisms, diagnostic techniques, failure analysis techniques and root cause corrective actions. Nuclear power plants are unique in that instrumentation and control circuits are continuously energized, are periodically tested, and have been in operation for greater than 25 years. Root cause evaluations at SONGS have identified numerous semiconductor failures due to wear out. Case studies include light output deterioration in opto-isolators, junction alloying failures of transistors and integrated circuits and parametric shifts in operational amplifiers. In most cases the devices do not fail catastrophically but degraded to the point of circuit level functional failure. Failure analysis techniques include circuit analysis, board level troubleshooting to identify the degraded components. Intermittent failures require power cycling, thermal cycling, and long term monitoring to identify the responsible components. Corrective actions for semiconductor wear out at SONGS include enhanced monitoring and proactive change out of identified part types.


Author(s):  
Bence Hevesi

Abstract In this paper, different failure analysis (FA) workflows are showed which combines different FA approaches for fast and efficient fault isolation and root cause analysis in system level products. Two case studies will be presented to show the importance of a well-adjusted failure analysis workflow.


2021 ◽  
Author(s):  
Harsh S Shah ◽  
Kaushalendra Chaturvedi ◽  
Shanming Kuang ◽  
Jian Wang

Precisely developed computational methodologies can allow the drug product lifecycle process to be time-efficient, cost-effective and reliable through a thorough fundamental understanding at the molecular level. Computational methodologies include computational simulations, virtual screening, mathematical modeling and predictive tools. In light of current trends and increased expectations of product discovery in early pharmaceutical development, we have discussed different case studies. These case studies clearly demonstrate the successful application of predictive tools alone or in combination with analytical techniques to predict the physicochemical properties of drug substances and drug products, thereby shortening research and development timelines. The overall goal of this report is to summarize unique predictive methodologies, which can assist pharmaceutical scientists in achieving time-sensitive research goals and avoiding associated risks that can potentially affect the drug product quality.


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