A flexible statistical model for CAD of submicrometer analog CMOS integrated circuits

Proceedings of 1993 International Conference on Computer Aided Design (ICCAD) ◽

10.1109/iccad.1993.580077 ◽

2002 ◽

Author(s):

C. Michael ◽

C. Abel ◽

C.S. Teng

Keyword(s):

Integrated Circuits ◽

Statistical Model ◽

Cmos Integrated Circuits ◽

Analog Cmos ◽

Analog Cmos Integrated Circuits

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Design of analog CMOS integrated circuits input stage for the operation at zero temperature coefficient using PSPICE

[1992] Proceedings of the 35th Midwest Symposium on Circuits and Systems ◽

10.1109/mwscas.1992.271345 ◽

2003 ◽

Author(s):

M.E. Rizkalla ◽

H.C. Gundrum

Keyword(s):

Integrated Circuits ◽

Temperature Coefficient ◽

Cmos Integrated Circuits ◽

Zero Temperature ◽

Input Stage ◽

Analog Cmos ◽

Analog Cmos Integrated Circuits

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Design Consideration in High Temperature Analog CMOS Integrated Circuits

IEEE Transactions on Components Hybrids and Manufacturing Technology ◽

10.1109/tchmt.1986.1136646 ◽

1986 ◽

Vol 9 (3) ◽

pp. 242-251 ◽

Author(s):

F. Shoucair

Keyword(s):

High Temperature ◽

Integrated Circuits ◽

Cmos Integrated Circuits ◽

Design Consideration ◽

Analog Cmos ◽

Analog Cmos Integrated Circuits

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Reform Research and Practice on Analog CMOS Integrated Circuits Design Course Based on OBE Mode

Proceedings of the International Conference on Modern Educational Technology and Innovation and Entrepreneurship (ICMETIE 2020) ◽

10.2991/assehr.k.200306.133 ◽

2020 ◽

Author(s):

Zekun Zhou ◽

Ping Luo

Keyword(s):

Integrated Circuits ◽

Cmos Integrated Circuits ◽

Research And Practice ◽

Analog Cmos ◽

Analog Cmos Integrated Circuits

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Gaussian Fitness Functions for Optimizing Analog CMOS Integrated Circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2017.2661804 ◽

2017 ◽

Vol 36 (10) ◽

pp. 1620-1632 ◽

Author(s):

Rodrigo Alves de Lima Moreto ◽

Carlos Eduardo Thomaz ◽

Salvador Pinillos Gimenez

Keyword(s):

Integrated Circuits ◽

Cmos Integrated Circuits ◽

Fitness Functions ◽

Analog Cmos ◽

Analog Cmos Integrated Circuits

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Design considerations in high temperature analog CMOS integrated circuits

Microelectronics Reliability ◽

10.1016/0026-2714(87)90114-4 ◽

1987 ◽

Vol 27 (4) ◽

pp. 790

Keyword(s):

High Temperature ◽

Integrated Circuits ◽

Cmos Integrated Circuits ◽

Design Considerations ◽

Analog Cmos ◽

Analog Cmos Integrated Circuits

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SiSMA—A Tool for Efficient Analysis of Analog CMOS Integrated Circuits Affected by Device Mismatch

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2003.822131 ◽

2004 ◽

Vol 23 (2) ◽

pp. 192-207 ◽

Author(s):

G. Biagetti ◽

S. Orcioni ◽

C. Turchetti ◽

P. Crippa ◽

M. Alessandrini

Keyword(s):

Integrated Circuits ◽

Cmos Integrated Circuits ◽

Device Mismatch ◽

Analog Cmos ◽

Analog Cmos Integrated Circuits

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Design Considerations in HighTemperature Analog CMOS Integrated Circuits

High-Temperature Electronics ◽

10.1109/9780470544884.ch32 ◽

2009 ◽

Keyword(s):

Integrated Circuits ◽

Cmos Integrated Circuits ◽

Design Considerations ◽

Analog Cmos ◽

Analog Cmos Integrated Circuits

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Transconductance/drain current based sensitivity analysis for analog CMOS integrated circuits

2013 IEEE 11th International New Circuits and Systems Conference (NEWCAS) ◽

10.1109/newcas.2013.6573605 ◽

2013 ◽

Author(s):

Jack Ou ◽

Pietro M. Ferreira

Keyword(s):

Sensitivity Analysis ◽

Integrated Circuits ◽

Drain Current ◽

Cmos Integrated Circuits ◽

Analog Cmos ◽

Analog Cmos Integrated Circuits

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Transconductance/drain current based distortion analysis for analog CMOS integrated circuits

10th IEEE International NEWCAS Conference ◽

10.1109/newcas.2012.6328956 ◽

2012 ◽

Author(s):

Jack Ou ◽

Farid Farahmand

Keyword(s):

Integrated Circuits ◽

Drain Current ◽

Cmos Integrated Circuits ◽

Analog Cmos ◽

Distortion Analysis ◽

Analog Cmos Integrated Circuits

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Analog CMOS integrated circuits for high-temperature operation with leakage current compensation

1998 Fourth International High Temperature Electronics Conference. HITEC (Cat. No.98EX145) ◽

10.1109/hitec.1998.676758 ◽

2002 ◽

Author(s):

K. Mizuno ◽

N. Ohta ◽

F. Kitagawa ◽

H. Nagase

Keyword(s):

High Temperature ◽

Integrated Circuits ◽

Leakage Current ◽

Cmos Integrated Circuits ◽

Current Compensation ◽

Analog Cmos ◽

Analog Cmos Integrated Circuits ◽

High Temperature Operation

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