Device architecture for terahertz characterization of organic electro-optic ultra-thin films using time-domain attenuated total reflection method
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1995 ◽
Vol 115
(11)
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pp. 1137-1143
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2003 ◽
Vol 21
(1-3)
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pp. 413-416
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2010 ◽
Vol 130
(2)
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pp. 193-197
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