An Equivalent Circuit Model for Negative Bias Temperature Instability Effect in 65nm PMOS
2013 ◽
Vol 60
(4)
◽
pp. 2635-2639
◽
2012 ◽
Vol 51
(2S)
◽
pp. 02BC07
◽
2012 ◽
Vol 51
(2)
◽
pp. 02BC07
◽
2013 ◽
Vol 32
(6)
◽
pp. 869-881
◽