An Equivalent Circuit Model for Negative Bias Temperature Instability Effect in 65nm PMOS

Author(s):  
Jun'An Zhang ◽  
Min Jiang ◽  
Qing' Wei Zhang
IEEE Access ◽  
2020 ◽  
Vol 8 ◽  
pp. 99037-99046
Author(s):  
Chao Peng ◽  
Zhifeng Lei ◽  
Rui Gao ◽  
Zhangang Zhang ◽  
Yiqiang Chen ◽  
...  

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