Suppression of leakage current of low-temperature polycrystalline silicon thin-film transistors by negative bias sweeping

2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) ◽

10.1109/icsict.2014.7021454 ◽

2014 ◽

Author(s):

Dongli Zhang ◽

Mingxing Wang ◽

Huaisheng Wang ◽

Qi Shan

Keyword(s):

Thin Film ◽

Low Temperature ◽

Leakage Current ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Negative Bias ◽

Silicon Thin Film

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Degradation of Low Temperature Polycrystalline Silicon Thin Film Transistors under Negative Bias Temperature Instability Stress with Illumination Effect

Journal of The Electrochemical Society ◽

10.1149/1.3265456 ◽

2010 ◽

Vol 157 (2) ◽

pp. J29 ◽

Author(s):

Chia-Sheng Lin ◽

Ying-Chung Chen ◽

Ting-Chang Chang ◽

Hung-Wei Li ◽

Wei-Che Hsu ◽

...

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Negative Bias ◽

Negative Bias Temperature Instability ◽

Silicon Thin Film ◽

Temperature Instability ◽

Bias Temperature Instability ◽

Illumination Effect

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Investigation of Degradation Behavior During Illuminated Negative Bias Temperature Stress in P-Channel Low-Temperature Polycrystalline Silicon Thin-Film Transistors

IEEE Electron Device Letters ◽

10.1109/led.2021.3068423 ◽

2021 ◽

Vol 42 (5) ◽

pp. 712-715

Author(s):

Yu-Xuan Wang ◽

Ting-Chang Chang ◽

Mao-Chou Tai ◽

Chia-Chuan Wu ◽

Yu-Fa Tu ◽

...

Keyword(s):

Thin Film ◽

Low Temperature ◽

Temperature Stress ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Negative Bias ◽

Degradation Behavior ◽

Silicon Thin Film ◽

Bias Temperature Stress

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Illumination-Assisted Negative Bias Temperature Instability Degradation in Low Temperature Polycrystalline Silicon Thin-Film Transistors

Electrochemical and Solid-State Letters ◽

10.1149/1.3115400 ◽

2009 ◽

Vol 12 (6) ◽

pp. H229 ◽

Author(s):

Chia-Sheng Lin ◽

Ying-Chung Chen ◽

Ting-Chang Chang ◽

Wei-Che Hsu ◽

Shih-Ching Chen ◽

...

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Negative Bias ◽

Negative Bias Temperature Instability ◽

Silicon Thin Film ◽

Temperature Instability ◽

Bias Temperature Instability

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Analysis of Negative Bias Temperature Instability Degradation in p-Type Low-Temperature Polycrystalline Silicon Thin-Film Transistors of Different Grain Sizes

IEEE Electron Device Letters ◽

10.1109/led.2019.2942102 ◽

2019 ◽

Vol 40 (11) ◽

pp. 1768-1771 ◽

Author(s):

Hong-Yi Tu ◽

Tsung-Ming Tsai ◽

Chia-Chuan Wu ◽

Yu-Ching Tsao ◽

Mao-Chou Tai ◽

...

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Negative Bias ◽

Negative Bias Temperature Instability ◽

Silicon Thin Film ◽

Grain Sizes ◽

Bias Temperature Instability ◽

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Plasma Damage-Enhanced Negative Bias Temperature Instability in Low-Temperature Polycrystalline Silicon Thin-Film Transistors

IEEE Electron Device Letters ◽

10.1109/led.2006.883564 ◽

2006 ◽

Vol 27 (11) ◽

pp. 893-895 ◽

Author(s):

C.-Y. Chen ◽

J.-W. Lee ◽

W.-C. Chen ◽

H.-Y. Lin ◽

K.-L. Yeh ◽

...

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Negative Bias ◽

Negative Bias Temperature Instability ◽

Silicon Thin Film ◽

Plasma Damage ◽

Temperature Instability ◽

Bias Temperature Instability

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Analysis of Negative Bias Temperature Instability in Body-Tied Low-Temperature Polycrystalline Silicon Thin-Film Transistors

IEEE Electron Device Letters ◽

10.1109/led.2007.914083 ◽

2008 ◽

Vol 29 (2) ◽

pp. 165-167 ◽

Author(s):

Chih-Yang Chen ◽

Ming-Wen Ma ◽

Wei-Cheng Chen ◽

Hsiao-Yi Lin ◽

Kuan-Lin Yeh ◽

...

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Negative Bias ◽

Negative Bias Temperature Instability ◽

Silicon Thin Film ◽

Temperature Instability ◽

Bias Temperature Instability

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Water-enhanced negative bias temperature instability in p-type low temperature polycrystalline silicon thin film transistors

Microelectronics Reliability ◽

10.1016/j.microrel.2013.07.082 ◽

2014 ◽

Vol 54 (1) ◽

pp. 30-32 ◽

Author(s):

Meng Zhang ◽

Wei Zhou ◽

Rongsheng Chen ◽

Man Wong ◽

Hoi-Sing Kwok

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Negative Bias ◽

Negative Bias Temperature Instability ◽

Silicon Thin Film ◽

Temperature Instability ◽

Bias Temperature Instability ◽

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Negative Bias Temperature Instability in Low-Temperature Polycrystalline Silicon Thin-Film Transistors

IEEE Transactions on Electron Devices ◽

10.1109/ted.2006.885543 ◽

2006 ◽

Vol 53 (12) ◽

pp. 2993-3000 ◽

Author(s):

Chih-Yang Chen ◽

Jam-Wem Lee ◽

Shen-De Wang ◽

Ming-Shan Shieh ◽

Po-Hao Lee ◽

...

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Negative Bias ◽

Negative Bias Temperature Instability ◽

Silicon Thin Film ◽

Temperature Instability ◽

Bias Temperature Instability

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Pixel-Level Digital-to-Analog Conversion Scheme for Compact Data Drivers of Active Matrix Organic Light-Emitting Diodes with Low-Temperature Polycrystalline Silicon Thin-Film Transistors

Japanese Journal of Applied Physics ◽

10.1143/jjap.49.03cd03 ◽

2010 ◽

Vol 49 (3) ◽

pp. 03CD03 ◽

Author(s):

Tae-Wook Kim ◽

Byong-Deok Choi

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Organic Light Emitting Diodes ◽

Silicon Thin Film ◽

Active Matrix ◽

Light Emitting ◽

Organic Light ◽

Conversion Scheme

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Reliability of Low Temperature Polycrystalline Silicon Thin-Film Transistors with Ultrathin Gate Oxide

Japanese Journal of Applied Physics ◽

10.1143/jjap.46.4021 ◽

2007 ◽

Vol 46 (7A) ◽

pp. 4021-4027 ◽

Author(s):

Hitoshi Ueno ◽

Yuta Sugawara ◽

Hiroshi Yano ◽

Tomoaki Hatayama ◽

Yukiharu Uraoka ◽

...

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film

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