Physics-based analytical model of quantum-mechanical electron wave function penetration into thin dielectric films for capacitance evaluation

Author(s):  
Y. Nakmori ◽  
K. Moriguchi ◽  
K. Komiya ◽  
Y. Omura
2014 ◽  
Vol 144 ◽  
pp. 26-31 ◽  
Author(s):  
Roy Shiloh ◽  
Yossi Lereah ◽  
Yigal Lilach ◽  
Ady Arie

2016 ◽  
Vol 12 (3) ◽  
pp. 1207-1219 ◽  
Author(s):  
Felix Plasser ◽  
Matthias Ruckenbauer ◽  
Sebastian Mai ◽  
Markus Oppel ◽  
Philipp Marquetand ◽  
...  

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