Physics-based analytical model of quantum-mechanical electron wave function penetration into thin dielectric films for capacitance evaluation
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2004 ◽
Vol 43
(3)
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pp. 1055-1061
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2005 ◽
Vol 49
(7)
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pp. 1118-1126
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1983 ◽
Vol 23
(1)
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pp. 27-45
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2016 ◽
Vol 12
(3)
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pp. 1207-1219
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