Multiferroic and structural transition properties of Bi1−xPrxFe0.95Mn0.05O3 thin films

2013 ◽  
Author(s):  
Hone-Zern Chen ◽  
Ming-Cheng Kao ◽  
San-Lin Young
Keyword(s):  
Thin Films ◽  
Structural Transition

Photoactivated birefringence in antiferroelectric thin films via a structural transition

1994 ◽  
Vol 65 (20) ◽  
pp. 2507-2509 ◽  
Author(s):  
Feiling Wang ◽  
Kewen K. Li ◽  
Gene H. Haertling
Keyword(s):  
Thin Films ◽  
Structural Transition

Structural Transition and Multiferroic Properties of Pr- and Mn-Doped BiFeO3 Thin Films

2015 ◽  
Vol 12 (5) ◽  
pp. 786-791
Author(s):  
Ming-Cheng Kao ◽  
Hone-Zern Chen ◽  
San-Lin Young ◽  
Jung-Lung Chiang ◽  
Po-Yen Chen
Keyword(s):  
Thin Films ◽  
Structural Transition ◽  
Multiferroic Properties ◽  
Bifeo3 Thin Films ◽  
Mn Doped

Structural transition of ZnO thin films produced by RF magnetron sputtering at low temperatures

2013 ◽  
Vol 24 (9) ◽  
pp. 3143-3148 ◽  
Author(s):  
A. M. Rosa ◽  
E. P. da Silva ◽  
M. Chaves ◽  
L. D. Trino ◽  
P. N. Lisboa-Filho ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetron Sputtering ◽  
Low Temperatures ◽  
Structural Transition ◽  
Rf Magnetron Sputtering ◽  
Zno Thin Films

A study of structural transition in nanocrystalline titania thin films by X-ray diffraction Rietveld method

2010 ◽  
Vol 45 (12) ◽  
pp. 1973-1977 ◽  
Author(s):  
S. Murugesan ◽  
N. Padhy ◽  
P. Kuppusami ◽  
U. Kamachi Mudali ◽  
E. Mohandas
Keyword(s):  
Thin Films ◽  
Structural Transition ◽  
Rietveld Method ◽  
X Ray Diffraction ◽  
X Ray ◽  
Nanocrystalline Titania

Structural transition induced enhancement of magnetization and magnetoresistance in epitaxial (Pr0.5Ba0.5MnO3)1−x:(CeO2)x vertically aligned thin films

CrystEngComm ◽  
2018 ◽  
Vol 20 (34) ◽  
pp. 5017-5024 ◽  
Author(s):  
Sheng Cheng ◽  
Lvkang Shen ◽  
Chunrui Ma ◽  
Shaodong Cheng ◽  
Yanzhu Dai ◽  
...  
Keyword(s):  
Thin Films ◽  
Structural Transition ◽  
Vertically Aligned

Structural transition induced enhancement of magnetization and magnetoresistance in (Pr0.5Ba0.5MnO3)1−x:(CeO2)x vertically aligned films.

Investigation of Tb-doping on structural transition and multiferroic properties of BiFeO3 thin films

2014 ◽  
Vol 40 (5) ◽  
pp. 6413-6419 ◽  
Author(s):  
Guohua Dong ◽  
Guoqiang Tan ◽  
Yangyang Luo ◽  
Wenlong Liu ◽  
Huijun Ren ◽  
...  
Keyword(s):  
Thin Films ◽  
Structural Transition ◽  
Multiferroic Properties ◽  
Bifeo3 Thin Films

Structural Transition and Multiferroic Properties of Eu-Doped BiFeO3 Thin Films

2010 ◽  
Vol 93 (9) ◽  
pp. 2743-2747 ◽  
Author(s):  
Zhongqiang Hu ◽  
Meiya Li ◽  
Jun Liu ◽  
Ling Pei ◽  
Jing Wang ◽  
...  
Keyword(s):  
Thin Films ◽  
Structural Transition ◽  
Multiferroic Properties ◽  
Bifeo3 Thin Films

Structural Transition in Thickness Dependent CSD Grown Nanostructure Manganite Thin Films

2014 ◽  
Vol 1047 ◽  
pp. 131-139 ◽  
Author(s):  
Tejas M. Tank ◽  
Chetan M. Thaker ◽  
J.A. Bhalodia
Keyword(s):  
Thin Films ◽  
Grain Size ◽  
Film Thickness ◽  
Structural Transition ◽  
Resistivity Measurement ◽  
Lattice Parameter ◽  
Hexagonal Structure ◽  
Electrical Resistivity Measurement ◽  
Solution Deposition ◽  
Force Microscopy

In this report, manganite thin films of La0.7Sr0.3MnO3(LSMO) of various thicknesses are carried out by using Chemical Solution Deposition (CSD) technique on(100)– oriented single crystalline LaAlO3(LAO) substrate. Desired film thickness was achieved via control of the number of deposition sequences. X-ray diffraction (XRD) study shows that 1stand 3rdcoatings of LSMO films have the cubic structure while 5thand 7thcoatings of LSMO films have hexagonal structure. As the film thickness increases, increase in lattice parameter(c)was observed. Surface morphological study was carried out using Atomic Force Microscopy (AFM). RMS roughness and grain size were found to increase with the thickness. It is interesting and noticeable that the structural transition occurs from cubic to hexagonal are clearly observed through XRD and AFM results. In electrical resistivity measurement, show the resistivity of all the samples decreases as the film thickness or grain size increases, but the trend inverts for the film with 7 coatings and the maximum MR with the value of 21.35 %, in Hexagonal structure.

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