Si nano-particle characterization by atomic force microscopy and electronic beam techniques

2017 ◽  
Author(s):  
Hao Tan ◽  
Jie Zhu ◽  
Yu Zhe Zhao ◽  
Ran He ◽  
Yin Zhe Ma ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Nano Particle ◽  
Particle Characterization ◽  
Force Microscopy ◽  
Atomic Force

Measurement of nano particle adhesion by atomic force microscopy using probability theory based analysis

2017 ◽  
Vol 50 (20) ◽  
pp. 205301 ◽  
Author(s):  
D Geiger ◽  
I Schrezenmeier ◽  
M Roos ◽  
T Neckernuss ◽  
M Lehn ◽  
...  
Keyword(s):  
Probability Theory ◽  
Atomic Force Microscopy ◽  
Particle Adhesion ◽  
Nano Particle ◽  
Force Microscopy ◽  
Atomic Force

Electrostatic Forces on the Surface of Metals as Measured by Atomic Force Microscopy

2000 ◽  
Vol 10 (1-2) ◽  
pp. 15
Author(s):  
Eugene Sprague ◽  
Julio C. Palmaz ◽  
Cristina Simon ◽  
Aaron Watson
Keyword(s):  
Atomic Force Microscopy ◽  
Electrostatic Forces ◽  
Force Microscopy ◽  
Atomic Force
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