Full-scale testing and performance evaluation of an active RFID system for positioning and personal mobility

Author(s):  
Vassilis Gikas ◽  
Andreas Dimitratos ◽  
Harris Perakis ◽  
Guenther Retscher ◽  
Andreas Ettlinger
2008 ◽  
Vol 31 (17) ◽  
pp. 4107-4116 ◽  
Author(s):  
Won-Ju Yoon ◽  
Sang-Hwa Chung ◽  
Seong-Joon Lee

Author(s):  
Celine Sches ◽  
Emmanuel Desdoit ◽  
Jacky Massaglia

Threaded and Coupled (T&C) riser connectors with High Strength Steels have been developed for deepwater top tensioned riser (TTR) applications up to 10,000ft Water Depth. These developments have been ongoing for a decade, and the resulting solutions are now becoming the standard in the industry. Due to the stringent fatigue requirements involved, new design and performance evaluation methods were needed and have been built over time. In this article, we will demonstrate how these methods were implemented into the standard development process of T&C connectors, with a focus on finite element analysis (FEA) techniques. This process includes full scale tests programs on resonant fatigue frames, statistical post treatment of the resulting data, and fatigue cracks expertise for failure mechanism analysis. These elements are a key for the evaluation of T&C connectors’ fatigue performance and for the determination of influencing parameters, leading to the proper design optimization possibilities. The application of these methods will be illustrated with actual examples on T&C connectors’ recent developments. Namely, we will describe FEA methodologies, testing methods and results post-treatment techniques. We will show how the connectors’ performance is eventually derived after such analysis and test data accumulation. The reader will see that innovative and effective fatigue enhancement techniques have resulted, along with premium fatigue compliant sealing devices. The experience and expertise gained, together with a continuous improvement process of our methods have made T&C riser connectors a viable solution to meet emerging needs within deepwater industry, including xHP-HT, SCR and flow lines.


2011 ◽  
Vol 171 (1) ◽  
pp. 113-126 ◽  
Author(s):  
Wim T.M. Audenaert ◽  
Yoshi Vermeersch ◽  
Stijn W.H. Van Hulle ◽  
Pascal Dejans ◽  
Ann Dumoulin ◽  
...  

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