Stability and Reliability for Zinc-Oxide Thin-Film Transistors by O2 Plasma Treatment

Author(s):  
Hsin Chiang You ◽  
Chao Yuan Huang ◽  
Ya Ling Wu
2011 ◽  
Vol 42 (1) ◽  
pp. 1170-1172 ◽  
Author(s):  
Hoon Yim ◽  
Dae-Hwan Kim ◽  
SeungChan Choi ◽  
Byung Gook Choi ◽  
Sul Lee ◽  
...  

2016 ◽  
Vol 8 (3) ◽  
pp. 2061-2070 ◽  
Author(s):  
Yesul Jeong ◽  
Christopher Pearson ◽  
Hyun-Gwan Kim ◽  
Man-Young Park ◽  
Hongdoo Kim ◽  
...  

2013 ◽  
Vol 114 (20) ◽  
pp. 204501 ◽  
Author(s):  
Jhe-Ciou Jhu ◽  
Ting-Chang Chang ◽  
Geng-Wei Chang ◽  
Ya-Hsiang Tai ◽  
Wu-Wei Tsai ◽  
...  

2009 ◽  
Vol 95 (1) ◽  
pp. 013507 ◽  
Author(s):  
Yeon-Keon Moon ◽  
Sih Lee ◽  
Woong-Sun Kim ◽  
Byung-Woo Kang ◽  
Chang-Oh Jeong ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document