Stability and Reliability for Zinc-Oxide Thin-Film Transistors by O2 Plasma Treatment
Keyword(s):
Keyword(s):
2011 ◽
Vol 42
(1)
◽
pp. 1170-1172
◽
Keyword(s):
2016 ◽
Vol 8
(3)
◽
pp. 2061-2070
◽
Keyword(s):
Keyword(s):
Keyword(s):
Keyword(s):
2015 ◽
Vol 54
(11)
◽
pp. 114102
◽
Keyword(s):