Towards built-in-self-test for SNR testing of a mixed-signal IC

1993 IEEE International Symposium on Circuits and Systems ◽

10.1109/iscas.1993.692969 ◽

2005 ◽

Author(s):

M.P. Toner ◽

G.W. Roberts

Keyword(s):

Mixed Signal ◽

Self Test ◽

Built In Self Test ◽

Mixed Signal Ic

Download Full-text

A Built-in Self-Test Circuitry Based on Reconfiguration for Analog and Mixed-Signal IC

Information Technology And Control ◽

10.5755/j01.itc.40.3.635 ◽

2011 ◽

Vol 40 (3) ◽

Author(s):

Sergey Mosin

Keyword(s):

Mixed Signal ◽

Self Test ◽

Built In Self Test ◽

Mixed Signal Ic

Download Full-text

Structural solution of reconfiguration based built-in self-test for analog and mixed-signal IC

2010 12th Biennial Baltic Electronics Conference ◽

10.1109/bec.2010.5630220 ◽

2010 ◽

Author(s):

Sergey Mosin

Keyword(s):

Mixed Signal ◽

Self Test ◽

Built In Self Test ◽

Structural Solution ◽

Mixed Signal Ic

Download Full-text

Towards built-in-self-test for SNR testing of a mixed-signal IC

1993 IEEE International Symposium on Circuits and Systems ◽

10.1109/iscas.1993.394044 ◽

2002 ◽

Author(s):

M.F. Toner ◽

G.W. Roberts

Keyword(s):

Mixed Signal ◽

Self Test ◽

Built In Self Test ◽

Mixed Signal Ic

Download Full-text

On-chip analog signal generation for mixed-signal built-in self-test

IEEE Journal of Solid-State Circuits ◽

10.1109/4.748183 ◽

1999 ◽

Vol 34 (3) ◽

pp. 318-330 ◽

Author(s):

B. Dufort ◽

G.W. Roberts

Keyword(s):

Analog Signal ◽

Signal Generation ◽

Mixed Signal ◽

Self Test ◽

Built In Self Test ◽

Download Full-text

Arbitrary-precision signal generation for mixed-signal built-in-self-test

IEEE Transactions on Circuits and Systems II Analog and Digital Signal Processing ◽

10.1109/82.735354 ◽

1998 ◽

Vol 45 (11) ◽

pp. 1425-1432 ◽

Author(s):

X. Haurie ◽

G.W. Roberts

Keyword(s):

Signal Generation ◽

Mixed Signal ◽

Self Test ◽

Built In Self Test ◽

Arbitrary Precision

Download Full-text

A mixed-signal built-in self-test approach for analog circuits

Southwest Symposium on Mixed-Signal Design, 2003. ◽

10.1109/ssmsd.2003.1190426 ◽

2003 ◽

Author(s):

C. Stroud ◽

J. Morton ◽

T. Islam ◽

H. Alassaly

Keyword(s):

Analog Circuits ◽

Mixed Signal ◽

Self Test ◽

Built In Self Test

Download Full-text

VDDQ: a built-in self-test scheme for analog on-chip diagnosis, compliant with the IEEE 1149.4 mixed-signal test bus standard

Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611) ◽

10.1109/iccdcs.2002.1004083 ◽

2003 ◽

Author(s):

G.O.D. Acevedo ◽

J. Ramirez-Angulo

Keyword(s):

Test Scheme ◽

Mixed Signal ◽

Self Test ◽

Built In Self Test ◽

Download Full-text

Built-in self-test and self-calibration for analog and mixed signal circuits

2019 IEEE International Test Conference (ITC) ◽

10.1109/itc44170.2019.9000120 ◽

2019 ◽

Author(s):

Tao Chen ◽

Degang Chen

Keyword(s):

Mixed Signal ◽

Self Calibration ◽

Mixed Signal Circuits ◽

Self Test ◽

Built In Self Test

Download Full-text

Characterization of a pseudo-random testing technique for analog and mixed-signal built-in-self-test

Proceedings 18th IEEE VLSI Test Symposium ◽

10.1109/vtest.2000.843851 ◽

2002 ◽

Author(s):

J.M. Tofte ◽

Chee-Kian Ong ◽

Jiun-Lang Huang ◽

Kwang-Ting Cheng

Keyword(s):

Random Testing ◽

Testing Technique ◽

Mixed Signal ◽

Self Test ◽

Built In Self Test

Download Full-text

Analog signal generation for built-in self-test of mixed-signal integrated circuits

Microelectronics Journal ◽

10.1016/s0026-2692(96)90016-6 ◽

1996 ◽

Vol 27 (1) ◽

pp. 103-104

Author(s):

S.L. Hurst

Keyword(s):

Integrated Circuits ◽

Analog Signal ◽

Signal Generation ◽

Mixed Signal ◽

Self Test ◽

Built In Self Test

Download Full-text