Built-in self-test and self-calibration for analog and mixed signal circuits

2019 IEEE International Test Conference (ITC) ◽

10.1109/itc44170.2019.9000120 ◽

2019 ◽

Author(s):

Tao Chen ◽

Degang Chen

Keyword(s):

Mixed Signal ◽

Self Calibration ◽

Mixed Signal Circuits ◽

Self Test ◽

Built In Self Test

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Design for testability and built-in self-test of mixed-signal circuits: a tutorial

Proceedings Tenth International Conference on VLSI Design ◽

10.1109/icvd.1997.568158 ◽

2002 ◽

Author(s):

A. Chatterjee ◽

N. Nagi

Keyword(s):

Design For Testability ◽

Mixed Signal ◽

Mixed Signal Circuits ◽

Self Test ◽

Built In Self Test

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Automated Generation of Built-In Self-Test and Measurement Circuitry for Mixed-Signal Circuits and Systems

2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems ◽

10.1109/dft.2009.43 ◽

2009 ◽

Author(s):

George J. Starr ◽

Jie Qin ◽

Bradley F. Dutton ◽

Charles E. Stroud ◽

F. Foster Dai ◽

...

Keyword(s):

Mixed Signal ◽

Automated Generation ◽

Mixed Signal Circuits ◽

Self Test ◽

Built In Self Test

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Towards built-in-self-test for SNR testing of a mixed-signal IC

1993 IEEE International Symposium on Circuits and Systems ◽

10.1109/iscas.1993.692969 ◽

2005 ◽

Author(s):

M.P. Toner ◽

G.W. Roberts

Keyword(s):

Mixed Signal ◽

Self Test ◽

Built In Self Test ◽

Mixed Signal Ic

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On-chip analog signal generation for mixed-signal built-in self-test

IEEE Journal of Solid-State Circuits ◽

10.1109/4.748183 ◽

1999 ◽

Vol 34 (3) ◽

pp. 318-330 ◽

Author(s):

B. Dufort ◽

G.W. Roberts

Keyword(s):

Analog Signal ◽

Signal Generation ◽

Mixed Signal ◽

Self Test ◽

Built In Self Test ◽

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Arbitrary-precision signal generation for mixed-signal built-in-self-test

IEEE Transactions on Circuits and Systems II Analog and Digital Signal Processing ◽

10.1109/82.735354 ◽

1998 ◽

Vol 45 (11) ◽

pp. 1425-1432 ◽

Author(s):

X. Haurie ◽

G.W. Roberts

Keyword(s):

Signal Generation ◽

Mixed Signal ◽

Self Test ◽

Built In Self Test ◽

Arbitrary Precision

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A mixed-signal built-in self-test approach for analog circuits

Southwest Symposium on Mixed-Signal Design, 2003. ◽

10.1109/ssmsd.2003.1190426 ◽

2003 ◽

Author(s):

C. Stroud ◽

J. Morton ◽

T. Islam ◽

H. Alassaly

Keyword(s):

Analog Circuits ◽

Mixed Signal ◽

Self Test ◽

Built In Self Test

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On-chip self-calibration of RF circuits using specification-driven built-in self test (S-BIST)

11th IEEE International On-Line Testing Symposium ◽

10.1109/iolts.2005.50 ◽

2005 ◽

Author(s):

Donghoon Han ◽

S.S. Akbay ◽

S. Bhattacharya ◽

A. Chatterjee ◽

W.R. Eisenstadt

Keyword(s):

Rf Circuits ◽

Self Calibration ◽

Self Test ◽

Built In Self Test ◽

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VDDQ: a built-in self-test scheme for analog on-chip diagnosis, compliant with the IEEE 1149.4 mixed-signal test bus standard

Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611) ◽

10.1109/iccdcs.2002.1004083 ◽

2003 ◽

Author(s):

G.O.D. Acevedo ◽

J. Ramirez-Angulo

Keyword(s):

Test Scheme ◽

Mixed Signal ◽

Self Test ◽

Built In Self Test ◽

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Characterization of a pseudo-random testing technique for analog and mixed-signal built-in-self-test

Proceedings 18th IEEE VLSI Test Symposium ◽

10.1109/vtest.2000.843851 ◽

2002 ◽

Author(s):

J.M. Tofte ◽

Chee-Kian Ong ◽

Jiun-Lang Huang ◽

Kwang-Ting Cheng

Keyword(s):

Random Testing ◽

Testing Technique ◽

Mixed Signal ◽

Self Test ◽

Built In Self Test

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Analog signal generation for built-in self-test of mixed-signal integrated circuits

Microelectronics Journal ◽

10.1016/s0026-2692(96)90016-6 ◽

1996 ◽

Vol 27 (1) ◽

pp. 103-104

Author(s):

S.L. Hurst

Keyword(s):

Integrated Circuits ◽

Analog Signal ◽

Signal Generation ◽

Mixed Signal ◽

Self Test ◽

Built In Self Test

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