On-chip analog signal generation for mixed-signal built-in self-test

IEEE Journal of Solid-State Circuits ◽

10.1109/4.748183 ◽

1999 ◽

Vol 34 (3) ◽

pp. 318-330 ◽

Author(s):

B. Dufort ◽

G.W. Roberts

Keyword(s):

Analog Signal ◽

Signal Generation ◽

Mixed Signal ◽

Self Test ◽

Built In Self Test ◽

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Analog signal generation for built-in self-test of mixed-signal integrated circuits

Microelectronics Journal ◽

10.1016/s0026-2692(96)90016-6 ◽

1996 ◽

Vol 27 (1) ◽

pp. 103-104

Author(s):

S.L. Hurst

Keyword(s):

Integrated Circuits ◽

Analog Signal ◽

Signal Generation ◽

Mixed Signal ◽

Self Test ◽

Built In Self Test

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Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits

10.1007/978-1-4615-2341-3 ◽

1995 ◽

Author(s):

Gordon W. Roberts ◽

Albert K. Lu

Keyword(s):

Integrated Circuits ◽

Analog Signal ◽

Signal Generation ◽

Mixed Signal ◽

Self Test ◽

Built In Self Test

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On-chip analog signal generator for mixed-signal built-in self-test

Proceedings of the IEEE 1998 Custom Integrated Circuits Conference (Cat. No.98CH36143) ◽

10.1109/cicc.1998.695038 ◽

2002 ◽

Author(s):

B. Dufort ◽

G.W. Roberts

Keyword(s):

Signal Generator ◽

Analog Signal ◽

Mixed Signal ◽

Self Test ◽

Built In Self Test ◽

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Arbitrary-precision signal generation for mixed-signal built-in-self-test

IEEE Transactions on Circuits and Systems II Analog and Digital Signal Processing ◽

10.1109/82.735354 ◽

1998 ◽

Vol 45 (11) ◽

pp. 1425-1432 ◽

Author(s):

X. Haurie ◽

G.W. Roberts

Keyword(s):

Signal Generation ◽

Mixed Signal ◽

Self Test ◽

Built In Self Test ◽

Arbitrary Precision

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VDDQ: a built-in self-test scheme for analog on-chip diagnosis, compliant with the IEEE 1149.4 mixed-signal test bus standard

Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611) ◽

10.1109/iccdcs.2002.1004083 ◽

2003 ◽

Author(s):

G.O.D. Acevedo ◽

J. Ramirez-Angulo

Keyword(s):

Test Scheme ◽

Mixed Signal ◽

Self Test ◽

Built In Self Test ◽

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Impulse signal generation and measurement technique for cost-effective Built-In Self Test in analog mixed-signal systems

2009 52nd IEEE International Midwest Symposium on Circuits and Systems ◽

10.1109/mwscas.2009.5235949 ◽

2009 ◽

Author(s):

Wimol San-Um ◽

Tachibana Masayoshi

Keyword(s):

Measurement Technique ◽

Cost Effective ◽

Signal Generation ◽

Mixed Signal ◽

Signal Systems ◽

Self Test ◽

Built In Self Test

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Built-in self-test scheme for on-chip diagnosis, compliant with the IEEE 1149.4 mixed-signal test bus standard

2002 IEEE International Symposium on Circuits and Systems. Proceedings (Cat. No.02CH37353) ◽

10.1109/iscas.2002.1009799 ◽

2003 ◽

Author(s):

G.O.D. Acevedo ◽

J. Ramirez-Angulo

Keyword(s):

Test Scheme ◽

Mixed Signal ◽

Self Test ◽

Built In Self Test ◽

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Memory Implementation in a System on Chip with Built-in Self-Test and Recovery Tools

Proceedings of Universities ELECTRONICS ◽

10.24151/1561-5405-2019-24-3-239-247 ◽

2019 ◽

Vol 24 (3) ◽

pp. 239-247

Author(s):

Vladimir G. Ryabtsev ◽

◽

Sergey V. Volobuev ◽

Keyword(s):

System On Chip ◽

Self Test ◽

Built In Self Test ◽

On Chip ◽

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Exploiting Network-on-Chip structural redundancy for a cooperative and scalable built-in self-test architecture

2011 Design, Automation & Test in Europe ◽

10.1109/date.2011.5763109 ◽

2011 ◽

Author(s):

A Strano ◽

C Gómez ◽

D Ludovici ◽

M Favalli ◽

M E Gómez ◽

...

Keyword(s):

Network On Chip ◽

Structural Redundancy ◽

Self Test ◽

Built In Self Test ◽

On Chip ◽

Test Architecture

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A Mixed-Voltage Sensor Readout Circuit With On-Chip Calibration and Built-In Self-Test

IEEE Sensors Journal ◽

10.1109/jsen.2007.897957 ◽

2007 ◽

Vol 7 (9) ◽

pp. 1225-1232 ◽

Author(s):

Andrew Mason ◽

Abhijeet V. Chavan ◽

Kensall D. Wise

Keyword(s):

Voltage Sensor ◽

Readout Circuit ◽

Self Test ◽

Built In Self Test ◽

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