Reducing Test-bus Power Consumption in Huffman Coding Based Test Data Compression for SOCs

2007 ◽  
Author(s):  
Chandan Giri ◽  
Santanu Chattopadhyay
Keyword(s):  
Power Consumption ◽  
Data Compression ◽  
Test Data ◽  
Huffman Coding ◽  
Test Data Compression

Optimal Selective Huffman Coding for Test-Data Compression

2007 ◽  
Vol 56 (8) ◽  
pp. 1146-1152 ◽  
Author(s):  
Xrysovalantis Kavousianos ◽  
Emmanouil Kalligeros ◽  
Dimitris Nikolos
Keyword(s):  
Data Compression ◽  
Test Data ◽  
Huffman Coding ◽  
Test Data Compression

A Test Data Compression Scheme Based on Mixed Fixed and Variable Length Coding

2009 ◽  
Vol 31 (10) ◽  
pp. 1826-1834 ◽  
Author(s):  
Wen-Fa ZHAN ◽  
Hua-Guo LIANG ◽  
Feng SHI ◽  
Zheng-Feng HUANG
Keyword(s):  
Data Compression ◽  
Test Data ◽  
Variable Length ◽  
Test Data Compression ◽  
Compression Scheme ◽  
Variable Length Coding

Test data compression of system-on-a-chip (SoC) based on partial runs reversing

2010 ◽  
Vol 24 (1) ◽  
pp. 23-28
Author(s):  
Yiming Ouyang ◽  
Baosheng Zou ◽  
Huaguo Liang ◽  
Xi’e Huang
Keyword(s):  
Data Compression ◽  
Test Data ◽  
Test Data Compression ◽  
System On A Chip

Test data compression technique based on partial data block reuse in SoC

2010 ◽  
Vol 24 (5) ◽  
pp. 487-493
Author(s):  
Yiming Ouyang ◽  
Xi'e Huang ◽  
Huaguo Liang ◽  
Baosheng Zou
Keyword(s):  
Data Compression ◽  
Test Data ◽  
Data Block ◽  
Test Data Compression ◽  
Compression Technique ◽  
Partial Data
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