Test Data Compression Using Four-Coded and Sparse Storage for Testing Embedded Core

2010 ◽  
pp. 434-443
Author(s):  
Zhang Ling ◽  
Kuang Ji-shun ◽  
You zhi-qiang
Keyword(s):  
Data Compression ◽  
Test Data ◽  
Test Data Compression

A Test Data Compression Scheme Based on Mixed Fixed and Variable Length Coding

2009 ◽  
Vol 31 (10) ◽  
pp. 1826-1834 ◽  
Author(s):  
Wen-Fa ZHAN ◽  
Hua-Guo LIANG ◽  
Feng SHI ◽  
Zheng-Feng HUANG
Keyword(s):  
Data Compression ◽  
Test Data ◽  
Variable Length ◽  
Test Data Compression ◽  
Compression Scheme ◽  
Variable Length Coding

Test data compression of system-on-a-chip (SoC) based on partial runs reversing

2010 ◽  
Vol 24 (1) ◽  
pp. 23-28
Author(s):  
Yiming Ouyang ◽  
Baosheng Zou ◽  
Huaguo Liang ◽  
Xi’e Huang
Keyword(s):  
Data Compression ◽  
Test Data ◽  
Test Data Compression ◽  
System On A Chip

Test data compression technique based on partial data block reuse in SoC

2010 ◽  
Vol 24 (5) ◽  
pp. 487-493
Author(s):  
Yiming Ouyang ◽  
Xi'e Huang ◽  
Huaguo Liang ◽  
Baosheng Zou
Keyword(s):  
Data Compression ◽  
Test Data ◽  
Data Block ◽  
Test Data Compression ◽  
Compression Technique ◽  
Partial Data
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