The paper considers a promising temperature control method for electronic equipment, that is, microthermostatting, which is characterised by maintaining a stable temperature in specific electric and radio devices. We show that the temperature error equation may be the most universal mathematical model for developing microthermostatted electronics. Statistical analysis methods concerning operation modes of an electronic circuit used in a device make it possible to obtain a regression model that forms the basis for deriving the temperature error equation. We propose to replace a physical factorial experiment with a numerical factorial experiment in order to reduce the time spent performing the statistical analysis. We note that it may be possible to implement this numerical factorial experiment using well-known circuit simulation software packages. The general form of the temperature error equation enables us to conclude that in the process of investigating the thermal stability of an electronic device there arise three subproblems: 1) the problem of synthesising fitting mathematical models for the electric and radio equipment; 2) the circuit modelling problem regarding the circuit used; 3) the topology design problem for computing the temperature field. In the experimental part of our investigation, we propose a simple design for a heater microthermostat in a voltage regulator. A feature of the microthermostat design is a microcontroller to form corrective actions affecting the actuators. In our studies we compared two voltage regulator designs: 1) without thermostatting; 2) using microthermostatting. We show that the thermostatted option displays thermal stability that is 2.68 times higher than that of the basic option
