A comparison of robustness between interference alignment and direct transmission

Author(s):  
Feng Zheng ◽  
Thomas Kaiser
Author(s):  
S. R. Herd ◽  
P. Chaudhari

Electron diffraction and direct transmission have been used extensively to study the local atomic arrangement in amorphous solids and in particular Ge. Nearest neighbor distances had been calculated from E.D. profiles and the results have been interpreted in terms of the microcrystalline or the random network models. Direct transmission electron microscopy appears the most direct and accurate method to resolve this issue since the spacial resolution of the better instruments are of the order of 3Å. In particular the tilted beam interference method is used regularly to show fringes corresponding to 1.5 to 3Å lattice planes in crystals as resolution tests.


2020 ◽  
Vol E103.B (7) ◽  
pp. 796-803
Author(s):  
Junyao RAN ◽  
Youhua FU ◽  
Hairong WANG ◽  
Chen LIU

Author(s):  
Peng Xu ◽  
Yunwu Wang ◽  
Gaojie Chen ◽  
Gaofeng Pan ◽  
Zhiguo Ding
Keyword(s):  

Author(s):  
Mojtaba Ghermezcheshmeh ◽  
Mohsen Mohammadkhani Razlighi ◽  
Vahid Shah-Mansouri ◽  
Nikola Zlatanov

Sign in / Sign up

Export Citation Format

Share Document