Three dimensional high dynamic range veillance for 3D range-sensing cameras

2013 ◽  
Author(s):  
Raymond Lo ◽  
Valmiki Rampersad ◽  
Jason Huang ◽  
Steve Mann
Keyword(s):  
Dynamic Range ◽  
Three Dimensional ◽  
High Dynamic Range ◽  
Range Sensing ◽  
High Dynamic

scholarly journals Adaptive Binocular Fringe Dynamic Projection Method for High Dynamic Range Measurement

Sensors ◽  
2019 ◽  
Vol 19 (18) ◽  
pp. 4023 ◽  
Author(s):  
Changzhi Yu ◽  
Fang Ji ◽  
Junpeng Xue ◽  
Yajun Wang
Keyword(s):  
Projection Method ◽  
Dynamic Range ◽  
Three Dimensional ◽  
High Dynamic Range ◽  
Fringe Projection ◽  
Range Measurement ◽  
Optimal Projection ◽  
Three Dimensional Measurement ◽  
High Dynamic ◽  
Adaptively Adjusting

Three-dimensional measurement with fringe projection sensor has been commonly researched. However, the measurement accuracy and efficiency of most fringe projection sensors are still seriously affected by image saturation and the non-linear effects of the projector. In order to solve the challenge, in conjunction with the advantages of stereo vision technology and fringe projection technology, an adaptive binocular fringe dynamic projection method is proposed. The proposed method can avoid image saturation by adaptively adjusting the projection intensity. Firstly, the flowchart of the proposed method is explained. Then, an adaptive optimal projection intensity method based on multi-threshold segmentation is introduced to adjust the projection illumination. Finally, the mapping relationship of binocular saturation point and projection point is established by binocular transformation and left camera–projector mapping. Experiments demonstrate that the proposed method can achieve higher accuracy for high dynamic range measurement.

scholarly journals Measuring SPM Piezo Displacement Responses

1999 ◽  
Vol 7 (4) ◽  
pp. 24-26
Author(s):  
Heinz Sturm ◽  
Markus Heyde ◽  
Klaus Radernann
Keyword(s):  
Scanning Probe Microscopy ◽  
Dynamic Range ◽  
Three Dimensional ◽  
Laser Interferometry ◽  
High Dynamic Range ◽  
Calibration Procedure ◽  
Short Contribution ◽  
Tilted Surface ◽  
Versatile Tool ◽  
High Dynamic

Scanning Probe Microscopy (SPU) is a versatile tool for the investigations of surfaces. Additionally to the three-dimensional examination of surface topography, local mechanical or electrical properties can be measured1. In this work we present a short contribution on the performance and reliability of piezoelectric transducers in a SPM, which take care of the fine positioning of the tip relative to the sample. Some of the calibration procedures known in literature [cited in 2] are: laser interferometry, scanning a slightly tilted surface, a grid, a crystallographic or artificial step of a known height or by using a reference piezo. To measure slow and fast piezo response simultaneously, we use a non-contact calibration procedure with a high dynamic range (Angstrom to several hundred micrometers) and high frequency range (D.C. to 200 kHz(-3dB)).

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