Determination of Critical Micelle Concentration (CMC) of Surfactants by Contact Angle Measurement Method

2021 ◽  
Author(s):  
Charin Seesomdee ◽  
Sukkaneste Tungasmita ◽  
Panadda Dechadilok
Keyword(s):  
Contact Angle ◽  
Critical Micelle Concentration ◽  
Measurement Method ◽  
Contact Angle Measurement ◽  
Angle Measurement

scholarly journals THE CONTACT ANGLE CONTROL OF THE SOLDER FOR IMPROVING THE SOLDERING QUALITY

2021 ◽  
pp. 161-166
Author(s):  
Чуйко М.М. ◽  
Завальський В.
Keyword(s):  
Contact Angle ◽  
Sessile Drop ◽  
Electrical Contact ◽  
Contact Angle Measurement ◽  
Angle Measurement ◽  
Soldering Process ◽  
Basic Parameters ◽  
The Right

High quality of the soldering process can be achieved with the right choice of the necessary soldering materials. Since wetting determines the further nature of the connection between the solder and the main soldering material, the contact angle  measurement  is the basis for quality control of soldering materials, provided that the basic requirements of the technological process. The determination of the contact angle value is carried out by the indirect method of the sessile drop, by measuring the basic parameters of the drop using infrared transducer. A smaller value of the contact angle corresponds to a better interaction of materials, and hence a better electrical contact

scholarly journals A Bespoke Contact Angle Measurement Software and Experimental Setup for Determination of Surface Tension

2013 ◽  
Vol 11 ◽  
pp. 487-494 ◽  
Author(s):  
Chin Fhong Soon ◽  
Wan Ibtisam Wan Omar ◽  
Nafarizal Nayan ◽  
Hatijah Basri ◽  
Martha Bt. Narawi ◽  
...  
Keyword(s):  
Surface Tension ◽  
Contact Angle ◽  
Contact Angle Measurement ◽  
Angle Measurement ◽  
Experimental Setup ◽  
Measurement Software

Rapid Determination of Organic Contaminations on Wafer Surfaces

2014 ◽  
Vol 219 ◽  
pp. 317-319
Author(s):  
Sylke Meyer ◽  
Sebastian Timmel ◽  
Christian Hagendorf
Keyword(s):  
Contact Angle ◽  
Organic Carbon ◽  
Rapid Determination ◽  
Contact Angle Measurement ◽  
Angle Measurement ◽  
Simple Contact ◽  
Wafer Surfaces ◽  
Detrimental Impact ◽  
Semiconductor Type

Irrespective of the semiconductor type and technology, organic contaminations on wafer surfaces have a detrimental impact on subsequent manufacturing steps and/or the device function. Therefore, it is of great interest to have a quick and reliable tool to detect those contaminations with sufficient sensitivity. In this study we investigated and optimized two methods which have the potential for in-line analytics since they are fast and simple: contact angle measurement and total organic carbon (TOC) determination. We present data on silicon wafer surfaces; however, the techniques may be suitable for all other wafer surfaces, too.

scholarly journals Contact Angle Measurement for The Surface Characterization of Solids

2011 ◽  
Vol 2 ◽  
pp. 1-4 ◽  
Author(s):  
D. P. Subedi
Keyword(s):  
Contact Angle ◽  
Surface Energy ◽  
Surface Characterization ◽  
Contact Angle Measurement ◽  
Angle Measurement ◽  
Liquid Model ◽  
Convenient Approach ◽  
Young's Equation

This paper reports a description of the theory of contact angle measurement and its use for the determination of surface energy of solids. The main objective of the work is to present a convenient approach to explain wetting phenomenon using contact angle theory. A brief review of Young’s equation and Young- Dupre equation is also presented followed by an extended Fowke’s equation widely used for the calculation of surface energy of solids. The two liquid model has been applied to determine the surface energy of polycarbonate and low density polyethylene.Key words: Contact angle; Surface energy; Surface characterization; Wettability; Young’s equation; Fowke’s modelThe Himalayan Physics Vol.2, No.2, May, 2011Page:1-4Uploaded Date: 31 July, 2011

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