A 25-Gb/s 5 × 5 mm2Chip-Scale Silicon-Photonic Receiver Integrated With 28-nm CMOS Transimpedance Amplifier

2016 ◽  
Vol 34 (12) ◽  
pp. 2988-2995 ◽  
Author(s):  
Daisuke Okamoto ◽  
Yasuyuki Suzuki ◽  
Kenichiro Yashiki ◽  
Yasuhiko Hagihara ◽  
Masatoshi Tokushima ◽  
...  
Author(s):  
Daisuke Okamoto ◽  
Yasuyuki Suzuki ◽  
Kenichiro Yashiki ◽  
Yasuhiko Hagihara ◽  
Masatoshi Tokushima ◽  
...  

Author(s):  
Jahnavi Sharma ◽  
Zhe Xuan ◽  
Hao Li ◽  
Taehwan Kim ◽  
Ranjeet Kumar ◽  
...  

2016 ◽  
Vol 24 (12) ◽  
pp. 3450-3459 ◽  
Author(s):  
Robert Polster ◽  
Yvain Thonnart ◽  
Guillaume Waltener ◽  
Jose-Luis Gonzalez ◽  
Eric Cassan

2009 ◽  
Vol E92-B (6) ◽  
pp. 2239-2242 ◽  
Author(s):  
Sang Hyun PARK ◽  
Quan LE ◽  
Bo-Hun CHOI

2009 ◽  
Vol E92-C (2) ◽  
pp. 217-223 ◽  
Author(s):  
Tao CHU ◽  
Hirohito YAMADA ◽  
Shigeru NAKAMURA ◽  
Masashige ISHIZAKA ◽  
Masatoshi TOKUSHIMA ◽  
...  

PIERS Online ◽  
2010 ◽  
Vol 6 (3) ◽  
pp. 273-278 ◽  
Author(s):  
David J. Moss ◽  
B. Corcoran ◽  
C. Monat ◽  
Christian Grillet ◽  
T. P. White ◽  
...  

Author(s):  
Stephan Kleindiek ◽  
Matthias Kemmler ◽  
Andreas Rummel ◽  
Klaus Schock

Abstract Using a compact nanoprobing setup comprising eight probe tips attached to piezo-driven micromanipulators, various techniques for fault isolation are performed on 28 nm samples inside an SEM. The recently implemented Current Imaging technique is used to quickly image large arrays of contacts providing a means of locating faults.


2014 ◽  
Vol 9 (9th) ◽  
pp. 1-12
Author(s):  
Mostafa Hosny ◽  
Sameh Ibrahim ◽  
DiaaEldin Khalil ◽  
Mohamed Dessouky

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