Extraction of a trapping model over an extended bias range for GaN and GaAs HEMTs

Author(s):  
Jabra Tarazi ◽  
James G. Rathmell ◽  
Anthony E. Parker ◽  
Simon J. Mahon
Keyword(s):  
1991 ◽  
Vol 46 (7) ◽  
pp. 616-620 ◽  
Author(s):  
Junko Habasaki

MD simulation has been performed to learn the microscopic mechanism of diffusion of ions in the Li2SiO3 system. The motion of lithium ions can be explained by the trapping model, where lithium is trapped in the polyhedron and moves with fluctuation of the coordination number. The mean square displacement of lithium was found to correlate well with the net changes in coordination number.


2021 ◽  
Author(s):  
John Wood ◽  
Zul Mokhti ◽  
Yueying Liu
Keyword(s):  

2012 ◽  
Vol 71 ◽  
pp. 74-79 ◽  
Author(s):  
Davide Garetto ◽  
Yoann Mamy Randriamihaja ◽  
Alban Zaka ◽  
Denis Rideau ◽  
Alexandre Schmid ◽  
...  

2008 ◽  
Vol 278 ◽  
pp. 1-10 ◽  
Author(s):  
M. Abdel-Rahman ◽  
N.A. Kamel ◽  
Yahia A. Lotfy ◽  
Emad A. Badawi ◽  
M.A. Abdel-Rahman

Positron Annihilation Doppler Broadening Spectroscopy (PADPS) is a nondestructive technique used in materials science. Electrical measurements are one of the oldest techniques also used in materials science. This paper aims to discuss the availability of using both PADPS and electrical measurements as diagnostic techniques to detect defects in a set of plastically deformed 5454 wrought aluminum alloys. The results of the positron annihilation measurements and the electrical measurements were analyzed in terms of the two-state trapping model. This model can be used to investigate both the defect and dislocation densities of the samples under investigation. Results obtained by both nuclear and electrical techniques have been reported.


1986 ◽  
Vol 3 (5) ◽  
pp. 237-240 ◽  
Author(s):  
Xiong Liangyue (L Y Xiong)

RSC Advances ◽  
2019 ◽  
Vol 9 (6) ◽  
pp. 3157-3161
Author(s):  
Bixin Li ◽  
Shiyang Zhang ◽  
Xianglin Li

The hole transport in organic bulk heterojunctions shows a transition from a mobility model to a trapping model with increasing temperature.


1984 ◽  
Vol 81 (1) ◽  
pp. K63-K65 ◽  
Author(s):  
H. von Berlepsch

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