Sub-surface spatial resolution of a near-field scanning microwave microscope

2016 ◽  
Author(s):  
Nicholas Estes ◽  
Jonathan Chisum
Keyword(s):  
Spatial Resolution ◽  
Near Field ◽  
Microwave Microscope ◽  
Near Field Scanning

Hard disk magnetic domain nano-spatial resolution imaging by using a near-field scanning microwave microscope with an AFM probe tip

2009 ◽  
Vol 321 (16) ◽  
pp. 2483-2487 ◽  
Author(s):  
Harutyun Melikyan ◽  
Tigran Sargsyan ◽  
Arsen Babajanyan ◽  
Seungwan Kim ◽  
Jongchel Kim ◽  
...  
Keyword(s):  
Spatial Resolution ◽  
Near Field ◽  
Magnetic Domain ◽  
Hard Disk ◽  
Microwave Microscope ◽  
Resolution Imaging ◽  
Afm Probe ◽  
Near Field Scanning

scholarly journals Improvement of spatial resolution by tilt correction in near-field scanning microwave microscopy

AIP Advances ◽  
2021 ◽  
Vol 11 (3) ◽  
pp. 035114
Author(s):  
Xianfeng Zhang ◽  
Zhe Wu ◽  
Quansong Lan ◽  
Zhiliao Du ◽  
Quanxin Zhou ◽  
...  
Keyword(s):  
Spatial Resolution ◽  
Near Field ◽  
Tilt Correction ◽  
Microwave Microscopy ◽  
Scanning Microwave Microscopy ◽  
Near Field Scanning

scholarly journals Measurement of high frequency conductivity of oxide-doped anti-ferromagnetic thin film with a near-field scanning microwave microscope

AIP Advances ◽  
2014 ◽  
Vol 4 (4) ◽  
pp. 047114 ◽  
Author(s):  
Z. Wu ◽  
A. D. Souza ◽  
B. Peng ◽  
W. Q. Sun ◽  
S. Y. Xu ◽  
...  
Keyword(s):  
Thin Film ◽  
High Frequency ◽  
Near Field ◽  
Microwave Microscope ◽  
Near Field Scanning

Investigation of photoconductivity of silicon solar cells by a near-field scanning microwave microscope

2009 ◽  
Vol 109 (8) ◽  
pp. 958-962 ◽  
Author(s):  
Jongchel Kim ◽  
Arsen Babajanyan ◽  
Tigran Sargsyan ◽  
Harutyun Melikyan ◽  
Seungwan Kim ◽  
...  
Keyword(s):  
Solar Cells ◽  
Near Field ◽  
Silicon Solar Cells ◽  
Microwave Microscope ◽  
Near Field Scanning

Phase transition of copper (II) phthalocyanine thin films characterized by a near-field scanning microwave microscope

2006 ◽  
Vol 499 (1-2) ◽  
pp. 318-321 ◽  
Author(s):  
Miehwa Park ◽  
Hyunjun Yoo ◽  
Hyungun Yoo ◽  
Seungwook Na ◽  
Songhui Kim ◽  
...  
Keyword(s):  
Thin Films ◽  
Phase Transition ◽  
Near Field ◽  
Microwave Microscope ◽  
Near Field Scanning

Label-Free DNA Detection Using a Near-Field Microwave

2006 ◽  
Vol 321-323 ◽  
pp. 1040-1043
Author(s):  
Kie Jin Lee ◽  
Arsen Babajayan ◽  
Song Hui Kim
Keyword(s):  
Dna Binding ◽  
Near Field ◽  
Physical Property ◽  
Label Free ◽  
Specific Sequence ◽  
Microwave Microscope ◽  
Dna Strands ◽  
Amplification Process ◽  
Target Probe ◽  
Near Field Scanning

A near-field scanning microwave microscope (NSMM) is used to study the physical properties of DNA strands with a specific sequence and image lamda-DNA bundles. After the hybridization process between target and capture sequences, specific DNA binding events leads to microwave reflection coefficient (S11) changes of the NSMM. These changes are caused by a modification of the physical dielectric constant due to sequence specific DNA binding. This study demonstrates significant potential of the NSMM as a nondestructive and noncontact tool to detect DNA strands without a target-probe amplification process and as a valuable technique to understand the physical property of DNA.

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