Single Event Upset tests for a CMOS 0.35μ front-end and readout electronics for high-flux particle detectors

2017 ◽  
Author(s):  
F. Fausti ◽  
R. Cirio ◽  
G. Mazza ◽  
A. Attili ◽  
S. Giordanengo ◽  
...  
Keyword(s):  
High Flux ◽  
Single Event Upset ◽  
Single Event ◽  
Particle Detectors ◽  
Readout Electronics ◽  
Front End

Single-event upset tests on the readout electronics for the pixel detectors of the PANDA experiment

2014 ◽  
Vol 9 (01) ◽  
pp. C01042-C01042 ◽  
Author(s):  
G Mazza ◽  
I Balossino ◽  
D Calvo ◽  
F De Mori ◽  
P De Remigis ◽  
...  
Keyword(s):  
Single Event Upset ◽  
Single Event ◽  
Readout Electronics ◽  
Panda Experiment ◽  
Pixel Detectors

SEU (Single Event Upset) Vulnerability of the Zilog Z-80 and NSC-800 Microprocessors,

1986 ◽  
Author(s):  
R. Koga ◽  
W. A. Kolasinski ◽  
C. King ◽  
J. Cusick
Keyword(s):  
Single Event Upset ◽  
Single Event

Single Event Upset Evaluation for a 28-nm FDSOI SRAM Type Buffer in an ARM Processor

2021 ◽  
Author(s):  
Shuting Shi ◽  
Rui Chen ◽  
Rui Liu ◽  
Mo Chen ◽  
Chen Shen ◽  
...  
Keyword(s):  
Single Event Upset ◽  
Single Event ◽  
Arm Processor ◽  
28 Nm

Impact of heavy ion energy and species on single-event upset in commercial floating gate cells

2021 ◽  
Vol 120 ◽  
pp. 114128
Author(s):  
Bing Ye ◽  
Li-Hua Mo ◽  
Peng-Fei Zhai ◽  
Li Cai ◽  
Tao Liu ◽  
...  
Keyword(s):  
Heavy Ion ◽  
Floating Gate ◽  
Single Event Upset ◽  
Single Event ◽  
Ion Energy
Sign in / Sign up

Export Citation Format

Share Document