The Failure-rate Aware Scheduling Policies for Large-scale Cluster Systems

2006 ◽  
Author(s):  
Linping Wu ◽  
Chao Ren ◽  
Dan Meng ◽  
Zhan Jianfeng ◽  
Bibo Tu
Keyword(s):  
Failure Rate ◽  
Large Scale ◽  
Cluster Systems ◽  
Scheduling Policies

Performance Implications of Periodic Checkpointing on Large-Scale Cluster Systems

2005 ◽  
Author(s):  
A.J. Oliner ◽  
R.K. Sahoo ◽  
J.E. Moreira ◽  
M. Gupta
Keyword(s):  
Large Scale ◽  
Cluster Systems

A comprehensive analytical model of interconnection networks in large-scale cluster systems

2007 ◽  
Vol 20 (1) ◽  
pp. 75-97 ◽  
Author(s):  
Bahman Javadi ◽  
Jemal H. Abawajy ◽  
Mohammad K. Akbari
Keyword(s):  
Analytical Model ◽  
Interconnection Networks ◽  
Large Scale ◽  
Cluster Systems

scholarly journals LogMaster: Mining Event Correlations in Logs of Large-Scale Cluster Systems

2012 ◽  
Author(s):  
Xiaoyu Fu ◽  
Rui Ren ◽  
Jianfeng Zhan ◽  
Wei Zhou ◽  
Zhen Jia ◽  
...  
Keyword(s):  
Large Scale ◽  
Cluster Systems

Industrial Perspective on Reliability of VLSI Devices

1991 ◽  
Vol 225 ◽  
Author(s):  
P. B. Ghate
Keyword(s):  
Integrated Circuits ◽  
Failure Rate ◽  
Large Scale ◽  
Semiconductor Industry ◽  
Test Methods ◽  
Lessons Learned ◽  
Limiting Factors ◽  
Current Status ◽  
Test Procedures ◽  
Process Reliability

ABSTRACTThe reliability of silicon integrated circuits (ICs) has improved significantly in the last decade. The complexity of ICs continues to increase. The semiconductor industry is actively working to a) improve the reliability of very large scale (VLSI) ICs, and b) reduce the failure rates to a value closer to 0.1 FIT by the year 2000. This paper summarizes the current status of quality and reliability of ICs. Some of the reliability limiting factors are described. Inadequacy of conventional accelerated test methods to verify the reliability of VLSI devices is highlighted. A challenging VLSI reliability goal with a failure rate approaching 0.1 FIT requires a) an understanding of the root causes of failure mechanisms, b) a translation of the lessons learned into a set of design rules for the circuit designers, c) appropriate materials and process specifications consistent with manufacturing capabilities, and d) in-process reliability test structures and test procedures. A VLSI failure rate goal of 0.1 FIT presents an exciting challenge for the materials scientists.

scholarly journals SW-LZMA: Parallel Implementation of LZMA Based on SW26010 Many-Core Processor

2021 ◽  
Vol 2021 ◽  
pp. 1-10
Author(s):  
Bingzheng Li ◽  
Jinchen Xu ◽  
Zijing Liu
Keyword(s):  
High Performance Computing ◽  
High Performance ◽  
Large Scale ◽  
Cluster Systems ◽  
Large Scale Data ◽  
Many Core ◽  
High Performance Computing Cluster ◽  
Performance Computing ◽  
Scale Data ◽  
Computing Cluster

With the development of high-performance computing and big data applications, the scale of data transmitted, stored, and processed by high-performance computing cluster systems is increasing explosively. Efficient compression of large-scale data and reducing the space required for data storage and transmission is one of the keys to improving the performance of high-performance computing cluster systems. In this paper, we present SW-LZMA, a parallel design and optimization of LZMA based on the Sunway 26010 heterogeneous many-core processor. Combined with the characteristics of SW26010 processors, we analyse the storage space requirements, memory access characteristics, and hotspot functions of the LZMA algorithm and implement the thread-level parallelism of the LZMA algorithm based on Athread interface. Furthermore, we make a fine-grained layout of LDM address space to achieve DMA double buffer cyclic sliding window algorithm, which optimizes the performance of SW-LZMA. The experimental results show that compared with the serial baseline implementation of LZMA, the parallel LZMA algorithm obtains a maximum speedup ratio of 4.1 times using the Silesia corpus benchmark, while on the large-scale data set, speedup is 5.3 times.

scholarly journals Influence of Large-scale and Subjective Factors on Technical Systems Ensuring Safety of Technological Processes Involving Protective Gas

2015 ◽  
Vol 4 (4) ◽  
pp. 16-23
Author(s):  
Гапонюк ◽  
N. Gaponyuk ◽  
Калугина ◽  
O. Kalugina ◽  
Львов ◽  
...  
Keyword(s):  
Failure Rate ◽  
Large Scale ◽  
Negative Impact ◽  
Comparative Assessment ◽  
Factors Associated ◽  
Technological Processes ◽  
Decisive Influence ◽  
Technical Systems ◽  
Protective Gas ◽  
Design Construction

Comparative assessment of the average failure rate of the basic elements of pneumatic systems has been presented. Structure oftechnical systems failures to ensure safety of technological processes involving protective gas has been described. Decisive influence of operating conditionsand parameters of protective gas industrial purity on safety of technological processes has been revealed.Regardless of the complexitylevel of the system, the occurrence of many kinds of failure is caused by negative impact of large-scale and subjective factors associated with the absence of objective monitoring of protective gasindustrial purity. Design, construction and operation of technical systems ensuring safety of technological processes involving protective gas is often based onprinciples typical for technological processes, not taking into account the specific features of operation of objects of protection.

scholarly journals P022 Unattended home sleep studies have a high recording failure rate in a preoperative anaesthetic clinic cohort when done as a routine screening procedure for Obstructive Sleep Apnoea (OSA)

2021 ◽  
Vol 2 (Supplement_1) ◽  
pp. A28-A29
Author(s):  
B Chuong ◽  
J Cho ◽  
J Wheatley
Keyword(s):  
Failure Rate ◽  
Large Scale ◽  
Sleep Apnoea ◽  
High Failure Rate ◽  
Sleep Study ◽  
Failure Group ◽  
Sleep Studies ◽  
Obstructive Sleep ◽  
Recorded Data ◽  
Home Sleep Study

Abstract Introduction Preoperative screening for OSA is strongly advised but attended laboratory sleep studies have limited availability. Portable unattended sleep monitors, such as ApneaLink, may provide a practical solution for large scale preoperative OSA screening. However, these unattended monitors may be prone to data recording failure. Methods We performed a prospective, uncontrolled, before-after study from March 2017 to December 2018 where patients from a pre-operative anaesthetic clinic were screened for OSA with an ApneaLink home sleep study (AHSS). 24 initial patients were provided with version 1 (v.1) recording instructions, while the next 24 patients received version 2 (v.2) which included colour, more detail and larger pictures compared to v.1. Recording failure was defined as an absence of recorded ApneaLink data. We analysed predictors of recording failure including instruction version and patient factors using logistic regression. Results Thirty-three of 48 (69%) patients successfully completed an AHSS. Failure rate was 31%. Median duration of recorded data was 480 minutes. The successful recording group was more likely to have used v.2 instructions than the failure group (61% vs. 27%; p=0.029). The odds ratio for successful recording using v.2 was 4.2 (95% CI: 1.1–16.2). Age, gender, country of birth, and number of days prior to surgery were not associated with recording failure. Discussion There was a high failure rate of AHSS for OSA screening from a preoperative anaesthetic clinic. Clear written instructions with greater use of colours and pictures may improve the recording success rate in this cohort.

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