An Accelerated Degradation Testing Method for Quantifying Lifetime of DC-DC Power Supply

Author(s):  
Qingchuan He ◽  
Jun Pan ◽  
Whenhua Chen
2001 ◽  
Vol 37 (9) ◽  
pp. 597
Author(s):  
H.C. Chiu ◽  
S.C. Yang ◽  
F.T. Chien ◽  
Y.J. Chan

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