High power testing of a 17 GHz photocathode RF gun

Author(s):  
S. Trotz ◽  
J.P. Hogge ◽  
K.E. Kreischer ◽  
R.J. Temkin
Author(s):  
S.C. Chen ◽  
B.G. Danly ◽  
J. Gonichon ◽  
C.L. Lin ◽  
R.J. Temkin ◽  
...  

2011 ◽  
Vol 58 (2) ◽  
pp. 198-204 ◽  
Author(s):  
Juho Hong ◽  
Sung-Ik Moon ◽  
Youg-Woon Parc ◽  
Moohyun Cho ◽  
In Soo Ko ◽  
...  

Author(s):  
S. Trotz ◽  
W. J. Brown ◽  
B. G. Danly ◽  
J.-P. Hogge ◽  
M. Khusid ◽  
...  

2007 ◽  
Vol 50 (95) ◽  
pp. 1443 ◽  
Author(s):  
J. H. Park ◽  
I. S. Ko ◽  
S. J. Park ◽  
Y. J. Park ◽  
S. H. Kim ◽  
...  

2007 ◽  
Vol 46 (4A) ◽  
pp. 1751-1756 ◽  
Author(s):  
Jang-Ho Park ◽  
Sung-Ju Park ◽  
Changbum Kim ◽  
Yong-Woon Parc ◽  
Ju-Ho Hong ◽  
...  

Author(s):  
Paola Furcas ◽  
Rosanna Pastorelli ◽  
Giulia Salmini ◽  
Massimo Vanzi

Abstract High optical power is considered as the source of failures in passive optical elements. Optical connectors, in particular, have been studied because of the unavoidable exposure of their optical interfaces to environmental issues during insertion and extraction. Cleaning and insertion/extraction procedures are investigated. Evidence for burn-out, depending on the different procedures, calls for new suitable rules for handling during equipment operation and testing.


Author(s):  
Jiahang Shao ◽  
Chunguang Jing ◽  
Eric Wisniewski ◽  
Gwanghui Ha ◽  
Manoel Conde ◽  
...  
Keyword(s):  
X Band ◽  

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