Experimental realization of floating-gate-memory thin-film transistor

1975 ◽  
Vol 63 (5) ◽  
pp. 826-827 ◽  
Author(s):  
K.K. Yu ◽  
T.P. Brody ◽  
P.C.Y. Chen
2010 ◽  
Vol 12 (12) ◽  
pp. 1966-1969 ◽  
Author(s):  
Byoungjun Park ◽  
Kyoungah Cho ◽  
Sungsu Kim ◽  
Sangsig Kim

2013 ◽  
Vol 773 ◽  
pp. 664-667
Author(s):  
Zhao Jun Guo ◽  
Li Qiang Guo ◽  
Guo Dong Wu

Thin film transistors with nanoparticles silicon floating-gate are fabricated by plasma enhanced chemical vapor deposition. It should be noted that SiO2acts as both a tunneling and a blocking layer. Meanwhile, some np-Si dots are embedded within SiO2layers. The electrical characteristic of the devices are measured by semiconductor parameter analyzer at room temperature. These Thin film transistors show a good device performance with a high charge-carrier mobility of 33 cm2/vs and a large on/off ratio of 1.2×106. Moreover, the capability of written and erasing was demonstrated. This indicates that thin film transistors can be operated as rewritable nonvolatile floating gate memory devices.


1999 ◽  
Vol 46 (2) ◽  
pp. 436-438 ◽  
Author(s):  
Sung-Hoi Hur ◽  
Nae-In Lee ◽  
Jin-Woo Lee ◽  
Chul-Hi Han

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