Single-Event Characterization of the 16 nm FinFET Xilinx UltraScale+TM RFSoC Field-Programmable Gate Array under Proton Irradiation
Keyword(s):
Keyword(s):
Keyword(s):
Keyword(s):
Keyword(s):
Keyword(s):
Keyword(s):
Keyword(s):
Keyword(s):
Keyword(s):
Keyword(s):