Single-Event Effects Test Results of the Intersil ISL73141SEH Precision SAR ADC

2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) ◽

10.1109/redw51883.2020.9325849 ◽

2020 ◽

Author(s):

J. M. Harris ◽

L. G. Pearce ◽

N. W. van Vonno ◽

E. J. Thomson

Keyword(s):

Sar Adc ◽

Test Results ◽

Single Event ◽

Single Event Effects

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NASA Goddard Space Flight Center’s Compendium of Total Ionizing Dose, Displacement Damage Dose, and Single-Event Effects Test Results

2019 IEEE Radiation Effects Data Workshop ◽

10.1109/redw.2019.8906647 ◽

2019 ◽

Author(s):

Alvson D. Topper ◽

Edward J. Wyrwas ◽

Kaitlyn Ryder ◽

Kenneth A. LaBel ◽

Jonathan A. Pellish ◽

...

Keyword(s):

Space Flight ◽

Test Results ◽

Single Event ◽

Total Ionizing Dose ◽

Displacement Damage ◽

Single Event Effects ◽

Damage Dose ◽

Nasa Goddard Space ◽

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2017 Compendium of Recent Test Results of Single Event Effects Conducted by the Jet Propulsion Laboratory's Radiation Effects Group

2017 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/nsrec.2017.8115429 ◽

2017 ◽

Author(s):

Gregory R. Allen ◽

Sergeh Vartanian ◽

Farokh Irom ◽

Leif Z. Scheick ◽

Philippe Adell ◽

...

Keyword(s):

Radiation Effects ◽

Test Results ◽

Single Event ◽

Single Event Effects ◽

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Single event effects test results for the 80C186 and 80C286 microprocessors and the SMJ320C30 and SMJ320C40 digital signal processors

1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.98TH8385) ◽

10.1109/redw.1998.731471 ◽

2002 ◽

Author(s):

S.H. Crain ◽

W.R. Crain ◽

K.B. Crawford ◽

S.J. Hansel ◽

P. Yu ◽

...

Keyword(s):

Digital Signal ◽

Digital Signal Processors ◽

Test Results ◽

Single Event ◽

Single Event Effects ◽

Signal Processors

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2015 Compendium of Recent Test Results of Single Event Effects Conducted by the Jet Propulsion Laboratory's Radiation Effects Group

2015 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/redw.2015.7336703 ◽

2015 ◽

Author(s):

Gregory R. Allen ◽

Leif Z. Scheick ◽

Farokh Irom ◽

Steven M. Guertin ◽

Philippe C. Adell ◽

...

Keyword(s):

Radiation Effects ◽

Test Results ◽

Single Event ◽

Single Event Effects ◽

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Single Event Effects and Total Dose Test Results for TI TLK2711 Transceiver

2008 IEEE Radiation Effects Data Workshop ◽

10.1109/redw.2008.19 ◽

2008 ◽

Author(s):

R. Koga ◽

P. Yu ◽

J. George

Keyword(s):

Test Results ◽

Single Event ◽

Single Event Effects

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Compendium of Test Results of Single Event Effects Conducted by the Jet Propulsion Laboratory

2008 IEEE Radiation Effects Data Workshop ◽

10.1109/redw.2008.11 ◽

2008 ◽

Author(s):

Gregory R. Allen

Keyword(s):

Test Results ◽

Single Event ◽

Single Event Effects ◽

Jet Propulsion ◽

Jet Propulsion Laboratory

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Megarad total ionizing dose and single event effects test results of a radhard-by-design 0.25 micron ASIC [space applications]

2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774) ◽

10.1109/redw.2004.1352914 ◽

2005 ◽

Author(s):

M. Hartwell ◽

C. Hafer ◽

P. Milliken ◽

T. Farris

Keyword(s):

Test Results ◽

Single Event ◽

Total Ionizing Dose ◽

Space Applications ◽

Single Event Effects

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Test results of single-event effects conducted by the jet propulsion laboratory

IEEE Radiation Effects Data Workshop, 2005. ◽

10.1109/redw.2005.1532662 ◽

2005 ◽

Author(s):

F. Irom ◽

T.F. Miyahira

Keyword(s):

Test Results ◽

Single Event ◽

Single Event Effects ◽

Jet Propulsion ◽

Jet Propulsion Laboratory

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Compendium of Single Event Effects Radiation Test Results from Ball Aerospace & Technologies Corp.

2013 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/redw.2013.6658190 ◽

2013 ◽

Author(s):

John Bird ◽

Rob Davies ◽

David DuVal ◽

Forrest Gasdia ◽

Charlie Hamp ◽

...

Keyword(s):

Test Results ◽

Single Event ◽

Single Event Effects ◽

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Single-event effects test results of 512MB SDRAMs

2003 IEEE Radiation Effects Data Workshop ◽

10.1109/redw.2003.1281355 ◽

2004 ◽

Author(s):

T. Langley ◽

R. Koga ◽

T. Morris

Keyword(s):

Test Results ◽

Single Event ◽

Single Event Effects

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