2008 IEEE Radiation Effects Data Workshop
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33
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9781424425457
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TID and SEE Tests of an Advanced 8 Gbit NAND-Flash Memory

2008 ◽  
Author(s):  
H. Schmidt ◽  
D. Walter ◽  
F. Gliem ◽  
B. Nickson ◽  
R. Harboe-Sorensen ◽  
...  
Keyword(s):  
Flash Memory ◽  
Nand Flash ◽  
Nand Flash Memory

Xilinx Virtex V Field Programmable Gate Array Dose Rate Upset Investigations

2008 ◽  
Author(s):  
Alonzo Vera ◽  
Daniel Llamocca ◽  
Joseph Fabula ◽  
William Kemp ◽  
Richard Marquez ◽  
...  
Keyword(s):  
Dose Rate ◽  
Field Programmable Gate Array ◽  
Field Programmable ◽  
Gate Array

Compendium of Recent Total Ionizing Dose Results for Candidate Spacecraft Electronics for NASA

2008 ◽  
Author(s):  
Donna J. Cochran ◽  
Stephen P. Buchner ◽  
Anthony B. Sanders ◽  
Kenneth A. LaBel ◽  
Martin A. Carts ◽  
...  
Keyword(s):  
Total Ionizing Dose

scholarly journals Standard Practice for Dosimetry of Proton Beams for use in Radiation Effects Testing of Electronics

2008 ◽  
Author(s):  
Margaret A. McMahan ◽  
Ewart Blackmore ◽  
Ethan W. Cascio ◽  
Carlos Castaneda ◽  
Barbara von Przewoski ◽  
...  
Keyword(s):  
Radiation Effects ◽  
Proton Beams ◽  
Standard Practice
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