A high speed dynamic power supply current sensor

Proceedings 2007 IEEE SoutheastCon ◽

10.1109/secon.2007.342997 ◽

2007 ◽

Author(s):

J. Roberts ◽

A. Eastridge ◽

D. Binkley ◽

Scott Thomas ◽

Rafic Makki

Keyword(s):

Power Supply ◽

Current Sensor ◽

Dynamic Power ◽

Supply Current ◽

Dynamic Power Supply Current

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SRAM test using on-chip dynamic power supply current sensor

Proceedings. International Workshop on Memory Technology, Design and Testing (Cat. No.98TB100236) ◽

10.1109/mtdt.1998.705947 ◽

2002 ◽

Author(s):

Jian Liu ◽

R.Z. Makki

Keyword(s):

Power Supply ◽

Current Sensor ◽

Dynamic Power ◽

Supply Current ◽

On Chip ◽

Dynamic Power Supply Current

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Catastrophic and parametric fault detection by dynamic power supply current test

10.1049/ic:19971201 ◽

1997 ◽

Author(s):

S. Bracho

Keyword(s):

Fault Detection ◽

Power Supply ◽

Dynamic Power ◽

Current Test ◽

Parametric Fault ◽

Supply Current ◽

Dynamic Power Supply Current

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Dynamic power supply current test for CMOS SRAM

ICVC '99. 6th International Conference on VLSI and CAD (Cat. No.99EX361) ◽

10.1109/icvc.1999.820944 ◽

2003 ◽

Author(s):

Doe Hyun Yoon ◽

Hong Sik Kim ◽

Sungho Kang

Keyword(s):

Power Supply ◽

Dynamic Power ◽

Current Test ◽

Supply Current ◽

Dynamic Power Supply Current

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Random current testing for CMOS logic circuits by monitoring a dynamic power supply current

Proceedings EURO-DAC '92: European Design Automation Conference ◽

10.1109/eurdac.1992.246200 ◽

2003 ◽

Author(s):

H. Tamamoto ◽

H. Yokoyama ◽

Y. Narita

Keyword(s):

Power Supply ◽

Logic Circuits ◽

Dynamic Power ◽

Current Testing ◽

Supply Current ◽

Dynamic Power Supply Current

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Dynamic Power Supply Current Testing for Open Defects in CMOS SRAMs

ETRI Journal ◽

10.4218/etrij.01.0101.0205 ◽

2001 ◽

Vol 23 (2) ◽

pp. 77-84 ◽

Author(s):

Doe-Hyun Yoon Yoon ◽

Hong-Sik Kim Kim ◽

Sungho Kang Kang

Keyword(s):

Power Supply ◽

Dynamic Power ◽

Current Testing ◽

Supply Current ◽

Open Defects ◽

Dynamic Power Supply Current

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A study on power integrity in a 3D chip stack using dynamic power supply current emulation and power noise monitoring

Proceedings of the 5th Electronics System-integration Technology Conference (ESTC) ◽

10.1109/estc.2014.6962728 ◽

2014 ◽

Author(s):

Yuuki Araga ◽

Ranto Miura ◽

Makoto Nagata ◽

Cesar Roda Neve ◽

Joeri De Vos ◽

...

Keyword(s):

Power Supply ◽

Power Integrity ◽

Dynamic Power ◽

Supply Current ◽

Power Noise ◽

Dynamic Power Supply Current

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Signature analysis for fault detection of mixed-signal ICs based on dynamic power-supply current

Journal of Electronic Testing ◽

10.1007/bf00137567 ◽

1996 ◽

Vol 9 (1-2) ◽

pp. 89-107 ◽

Author(s):

Javier Arg�elles ◽

Salvador Bracho

Keyword(s):

Fault Detection ◽

Power Supply ◽

Signature Analysis ◽

Mixed Signal ◽

Dynamic Power ◽

Supply Current ◽

Dynamic Power Supply Current

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A current testing for CMOS logic circuits applying random patterns and monitoring dynamic power supply current

Proceedings First Asian Test Symposium (ATS `92) ◽

10.1109/ats.1992.224438 ◽

2003 ◽

Author(s):

H. Tamamoto ◽

H. Yokoyama ◽

Y. Narita

Keyword(s):

Power Supply ◽

Logic Circuits ◽

Dynamic Power ◽

Current Testing ◽

Supply Current ◽

Random Patterns ◽

A Current ◽

Dynamic Power Supply Current

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Dynamic power supply current testing of CMOS SRAMs

Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259) ◽

10.1109/ats.1998.741637 ◽

2002 ◽

Author(s):

Jian Liu ◽

R.Z. Makki ◽

A. Kayssi

Keyword(s):

Power Supply ◽

Dynamic Power ◽

Current Testing ◽

Supply Current ◽

Dynamic Power Supply Current

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An approach for detecting bridging faults in CMOS domino logic circuits using dynamic power supply current monitoring

1997 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems ◽

10.1109/dftvs.1997.628334 ◽

2002 ◽

Author(s):

A. Walker ◽

A.P. Henry ◽

P.K. Lala

Keyword(s):

Power Supply ◽

Logic Circuits ◽

Bridging Faults ◽

Domino Logic ◽

Dynamic Power ◽

Supply Current ◽

Current Monitoring ◽

Dynamic Power Supply Current

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