The Method of Semiconductor Structure Impedance Measurement

International Workshops and Tutorials on Electron Devices and Materials ◽

10.1109/sibedm.2006.231661 ◽

2006 ◽

Author(s):

Nikolay Zayeev

Keyword(s):

Impedance Measurement ◽

Semiconductor Structure

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Charge and potential of an inversion layer in a metalinsulator-semiconductor structure in a quantizing magnetic field

Uspekhi Fizicheskih Nauk ◽

10.3367/ufnr.0146.198507h.0536 ◽

1985 ◽

Vol 146 (7) ◽

pp. 536

Author(s):

V.M. Pudalov ◽

S.G. Semenchinskii ◽

Valeryan S. Edel'man

Keyword(s):

Magnetic Field ◽

Inversion Layer ◽

Semiconductor Structure ◽

Quantizing Magnetic Field

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An Impedance Measurement Method of Solar Panels by Power Converter using PRBS

IEEJ Transactions on Industry Applications ◽

10.1541/ieejias.140.140 ◽

2020 ◽

Vol 140 (3) ◽

pp. 140-147

Author(s):

Koji Takechi ◽

Takeshi Yokoi ◽

Hiroaki Kakigano

Keyword(s):

Measurement Method ◽

Impedance Measurement ◽

Power Converter ◽

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Evaluation for Electrochemical Impedance Measurement of Carbon Nanotube Taste Sensor

IEEJ Transactions on Sensors and Micromachines ◽

10.1541/ieejsmas.131.26 ◽

2011 ◽

Vol 131 (1) ◽

pp. 26-34 ◽

Author(s):

Naoki Takeda ◽

Takamichi Hirata ◽

Masahiro Akiya

Keyword(s):

Carbon Nanotube ◽

Electrochemical Impedance ◽

Impedance Measurement ◽

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Sensitivity Improvement of Dielectrophoretic Impedance Measurement by Bacteria Concentration using Negative Dielectrophoresis

IEEJ Transactions on Sensors and Micromachines ◽

10.1541/ieejsmas.136.148 ◽

2016 ◽

Vol 136 (5) ◽

pp. 148-152

Author(s):

Yuki Inoue ◽

Michihiko Nakano ◽

Junya Suehiro

Keyword(s):

Impedance Measurement ◽

Sensitivity Improvement

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Power Dependent Impedance Measurement Exploiting an Oscilloscope and Möbius Transformation

IEICE Transactions on Electronics ◽

10.1587/transele.e100.c.918 ◽

2017 ◽

Vol E100.C (10) ◽

pp. 918-923

Author(s):

Sonshu SAKIHARA ◽

Masaru TAKANA ◽

Naoki SAKAI ◽

Takashi OHIRA

Keyword(s):

Impedance Measurement ◽

Möbius Transformation ◽

Mobius Transformation

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Electron-Wave Phenomena in the Composite Semiconductor Structure

Telecommunications and Radio Engineering ◽

10.1615/telecomradeng.v67.i20.80 ◽

2008 ◽

Vol 67 (20) ◽

pp. 1871-1878 ◽

Author(s):

V. A. Abdulkadyrov ◽

D. V. Abdulkadyrov ◽

E. M. Khutoryan

Keyword(s):

Semiconductor Structure ◽

Electron Wave ◽

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A Comparison of Acoustic Impedance Measurement Techniques

10.21236/ada255566 ◽

1992 ◽

Author(s):

Andrew J. Hull

Keyword(s):

Acoustic Impedance ◽

Measurement Techniques ◽

Impedance Measurement

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Transmission-line impedance measurement at microwave frequencies

Electronics and Power ◽

10.1049/ep.1973.0442 ◽

1973 ◽

Vol 19 (15) ◽

pp. 363

Author(s):

J.W. Gould

Keyword(s):

Transmission Line ◽

Impedance Measurement ◽

Microwave Frequencies

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Accurate thermal impedance measurement for semiconductor lasers by the double modes of fiber grating lasers

1996 Proceedings 46th Electronic Components and Technology Conference ◽

10.1109/ectc.1996.517452 ◽

2002 ◽

Author(s):

S.Y. Huang

Keyword(s):

Semiconductor Lasers ◽

Impedance Measurement ◽

Fiber Grating ◽

Thermal Impedance

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Does the Baseline Impedance Measurement during Radiof requency Catheter Ablation Influence the Likelihood of an Impedance Rise?

10.1159/000177058 ◽

1996 ◽

Vol 87 (1) ◽

pp. 42-45 ◽

Author(s):

Alan B. Wagshal ◽

Luis A. Pires ◽

Gregory J. Bonavita ◽

Robert S. Mittleman ◽

Shoei K. Stephen Huang

Keyword(s):

Catheter Ablation ◽

Impedance Measurement

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