MOSFET hot-carrier induced gate current simulation by self-consistent silicon/oxide Monte Carlo device simulation
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2003 ◽
Vol 47
(9)
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pp. 1507-1514
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2003 ◽
Vol 50
(2)
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pp. 440-446
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2003 ◽
Vol 2
(2-4)
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pp. 97-103
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