MOSFET hot-carrier induced gate current simulation by self-consistent silicon/oxide Monte Carlo device simulation

Author(s):  
A. Ghetti
2003 ◽  
Vol 2 (2-4) ◽  
pp. 97-103 ◽  
Author(s):  
Tatsuya Ezaki ◽  
Philipp Werner ◽  
Masami Hane

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