A Physics-Based TCAD Simulator for Superconducting Electronics Based on Josephson Junctions

2020 ◽  
Vol 30 (7) ◽  
pp. 1-5
Author(s):  
Prasad Sarangapani ◽  
Amrit Poudel ◽  
Lee Smith
Author(s):  
Ivan P Nevirkovets ◽  
Mikhail A Belogolovskii ◽  
John B Ketterson

Abstract We have fabricated and characterized all-MoGe Josephson junctions with a very thin Al/AlOx/(Al) barrier, where the amorphous MoGe films exhibit superconducting transition temperatures up to 7 K. Due to the uniformity of the surface morphology of the MoGe films, the junctions demonstrate high uniformity of their tunneling properties. The experimental data on the temperature dependence of the subgap current agree well with theoretical calculations. The results obtained imply that Josephson tunnel junctions based on amorphous superconductors are promising candidates for use in superconducting electronics, especially in applications requiring multiple stacked junctions or the creation of a nonequilibrium quasiparticle distribution.


2003 ◽  
Vol 17 (04n06) ◽  
pp. 696-702 ◽  
Author(s):  
V. LACQUANITI ◽  
S. MAGGI ◽  
R. STENI ◽  
C. CAGLIERO ◽  
R. ROCCI ◽  
...  

Overdamped Josephson junctions are gaining interest in many fields of superconducting electronics. The characteristic voltage ICRN is the parameter limiting the highest possible speed and voltage resolution of the junctions. Nb/Al/Nb technology is a good candidate for these devices because of its wide range of characteristic voltages. In our laboratory we have so far fabricated Nb/Al/Nb SNS junctions having (a) high critical currents and smooth interfaces, (b) low critical currents and smooth interfaces, (c) low critical currents and rough interfaces. However, further improvements to this technology are still needed.


2002 ◽  
Vol 12 (3) ◽  
pp. 133-136 ◽  
Author(s):  
M. Podt ◽  
B. G.A. Rolink ◽  
J. Flokstra ◽  
H. Regalia
Keyword(s):  

1998 ◽  
Vol 08 (PR3) ◽  
pp. Pr3-297-Pr3-300 ◽  
Author(s):  
S. Linzen ◽  
Y. J. Tian ◽  
U. Hübner ◽  
F. Schmidl ◽  
J. Scherbel ◽  
...  

2006 ◽  
Vol 20 (2) ◽  
pp. S28-S33 ◽  
Author(s):  
A Yurgens ◽  
L X You ◽  
M Torstensson ◽  
D Winkler

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