Design and Application of a T.V. Video Output Transistor

1968 ◽  
Vol 14 (3) ◽  
pp. 19-24
Author(s):  
N. P. Doyle ◽  
T. B. Mills ◽  
R. T. Westlake
Keyword(s):  
Output Transistor ◽  
Design And Application

Design and Application of Smart and Electrical Wheelchair and Charging Station for the Disabled Citizen

2020 ◽  
Vol 3 (1) ◽  
pp. 346-353
Author(s):  
Naim Suleyman Tinğ ◽  
Huseyin Ozel ◽  
Lokman Celik ◽  
Enes Ganidagli ◽  
Hilal Akkamis
Keyword(s):  
Smart Home ◽  
Touch Screen ◽  
Direct Access ◽  
Charging Station ◽  
The Disabled ◽  
Solar Powered ◽  
Home Technology ◽  
Smart Home Technology ◽  
Smart Wheelchair ◽  
Design And Application

In this paper, the design and application of smart wheelchair and charging station for disabled citizen is realized. The first stage of the paper is to make the wheelchair used by our disabled citizens able to access smart home technology via the vehicle via touch screen. The ability of citizens with disabilities to call with direct access via touch screen is also in the wheelchair designed. Thanks to the touch screen placed on the vehicle, disabled citizens are provided with the control of smart automation to control many objects such as curtains and doors in the home. In the second part of the paper, a solar powered charging station is designed and installed in order to charge battery powered wheelchairs. In the charging station made a special card reader system and has the charger to charge the card with disabilities to actively and means are provided.

Analysis Approach on DMOS Transistor Vth Mismatch Due to Trapped Charges

2015 ◽  
Author(s):  
Hashim Ismail ◽  
Ang Chung Keow ◽  
Kenny Gan Chye Siong
Keyword(s):  
Failure Analysis ◽  
Threshold Voltage ◽  
Gate Oxide ◽  
Analysis Approach ◽  
Test Results ◽  
Root Cause ◽  
Switching Event ◽  
Output Transistor ◽  
Event Based ◽  
Trapped Charge

Abstract An output switching malfunction was reported on a bridge driver IC. The electrical verification testing revealed evidence of an earlier over current condition resulting from an abnormal voltage sense during a switching event. Based on these test results, we developed the hypothesis that a threshold voltage mismatch existed between the sense transistor and the output transistor. This paper describes the failure analysis approach we used to characterize the threshold voltage mismatch as well as our approach to determine the root cause, which was trapped charge on the gate oxide of the sense transistor.

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