Scan-BIST based on transition probabilities for circuits with single and multiple scan chains
2006 ◽
Vol 25
(3)
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pp. 591-596
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2018 ◽
Vol 65
(3)
◽
pp. 361-365
◽
2011 ◽
Vol 25
(7)
◽
pp. 654-660
2008 ◽
Vol 16
(7)
◽
pp. 926-931
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