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Design of Test Compression for Multiple Scan Chains Circuits
Mapping Intimacies
◽
10.1109/icscan53069.2021.9526387
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2021
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Author(s):
D Manasa Manikya
◽
Marala Jagruthi
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Rana Anjum
◽
Ashok Kumar K
Keyword(s):
Test Compression
◽
Multiple Scan
◽
Scan Chains
Download Full-text
Related Documents
Cited By
References
Test compression for circuits with multiple scan chains
2015 16th Latin-American Test Symposium (LATS)
◽
10.1109/latw.2015.7102510
◽
2015
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Author(s):
Ondrej Novak
◽
Jiri Jenícek
◽
Martin Rozkovec
Keyword(s):
Test Compression
◽
Multiple Scan
◽
Scan Chains
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Test Power Minimization Using Multiple Scan Chains
Power-constrained Testing of VLSI Circuits - Frontiers in Electronic Testing
◽
10.1007/0-306-48731-4_5
◽
2006
◽
pp. 87-112
Keyword(s):
Power Minimization
◽
Test Power
◽
Multiple Scan
◽
Scan Chains
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Data compression for multiple scan chains using dictionaries with corrections
2004 International Conferce on Test
◽
10.1109/test.2004.1387357
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2005
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Cited By ~ 38
Author(s):
A. Wurtenberger
◽
C.S. Tautermann
◽
S. Hellebrand
Keyword(s):
Data Compression
◽
Multiple Scan
◽
Scan Chains
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Low Power Test Compression Technique for Designs with Multiple Scan Chain
14th Asian Test Symposium (ATS'05)
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10.1109/ats.2005.76
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2005
◽
Cited By ~ 10
Author(s):
Youhua Shi
◽
N. Togawa
◽
M. Yanagisawa
◽
T. Ohtsuki
◽
S. Kimura
Keyword(s):
Low Power
◽
Compression Technique
◽
Power Test
◽
Test Compression
◽
Low Power Test
◽
Multiple Scan
◽
Scan Chain
Download Full-text
Parahel core testing with multiple scan chains by test vector overlapping
2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test, 2005. (VLSI-TSA-DAT).
◽
10.1109/vdat.2005.1500056
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2005
◽
Cited By ~ 1
Author(s):
T. Shinogi
◽
Y. Yamada
◽
T. Hayashi
◽
T. Yoshikawa
◽
S. Tsuruoka
Keyword(s):
Test Vector
◽
Multiple Scan
◽
Scan Chains
Download Full-text
Operation about multiple scan chains based on system-on-chip
2008 International SoC Design Conference
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10.1109/socdc.2008.4815716
◽
2008
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Cited By ~ 3
Author(s):
Insoo Kim
◽
Hyoung Bok Min
Keyword(s):
System On Chip
◽
Multiple Scan
◽
Scan Chains
◽
On Chip
Download Full-text
Virtual scan chains reordering using a RAM-based module for high test compression
Microelectronics Journal
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10.1016/j.mejo.2012.06.003
◽
2012
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Vol 43
(11)
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pp. 869-872
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Cited By ~ 2
Author(s):
Zhang Ling
◽
Kuang Ji-Shun
◽
You Zhi-Qiang
Keyword(s):
Test Compression
◽
Scan Chains
◽
High Test
Download Full-text
Scan-BIST based on transition probabilities for circuits with single and multiple scan chains
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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10.1109/tcad.2005.854634
◽
2006
◽
Vol 25
(3)
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pp. 591-596
◽
Cited By ~ 5
Author(s):
I. Pomeranz
◽
S.M. Reddy
Keyword(s):
Transition Probabilities
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Multiple Scan
◽
Scan Chains
Download Full-text
Energy-Efficient Scheme for Multiple Scan-Chains BIST Using Weight-Based Segmentation
IEEE Transactions on Circuits & Systems II Express Briefs
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10.1109/tcsii.2016.2617160
◽
2018
◽
Vol 65
(3)
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pp. 361-365
◽
Cited By ~ 2
Author(s):
Abdallatif S. Abu-Issa
Keyword(s):
Energy Efficient
◽
Multiple Scan
◽
Efficient Scheme
◽
Scan Chains
Download Full-text
On the coverage of delay faults in scan designs with multiple scan chains
Proceedings. IEEE International Conference on Computer Design: VLSI in Computers and Processors
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10.1109/iccd.2002.1106771
◽
2003
◽
Cited By ~ 4
Author(s):
I. Pomeranz
◽
S.M. Reddy
Keyword(s):
Delay Faults
◽
Multiple Scan
◽
Scan Chains
Download Full-text
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