A Method of Defect Detection for Focal Hard Samples PCB Based on Extended FPN Model

Author(s):  
Cui-jin Li ◽  
Zhong Qu ◽  
Shi-yan Wang ◽  
Kang-hua Bao ◽  
Sheng-ye Wang
2017 ◽  
Vol 19 (6) ◽  
pp. 38
Author(s):  
Chengchao Guo ◽  
Pengfei Xu ◽  
Can Cui

2011 ◽  
Vol 131 (9) ◽  
pp. 1633-1641
Author(s):  
Toshifumi Honda ◽  
Kenji Obara ◽  
Minoru Harada ◽  
Hajime Igarashi

2014 ◽  
Vol 68 (3) ◽  
pp. 311-313
Author(s):  
Jason Zyglis ◽  
Wayne Killmer ◽  
Atsushi Kurosaki

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