Modeling and simulation of a nanoscale three-region tri-material gate stack (TRIMGAS) MOSFET for improved carrier transport efficiency and reduced hot-electron effects
2006 ◽
Vol 53
(7)
◽
pp. 1623-1633
◽
Keyword(s):
Keyword(s):
2002 ◽
Vol 49
(11)
◽
pp. 1928-1938
◽
2000 ◽
Vol 85
(8)
◽
pp. 1718-1721
◽
1987 ◽
Vol 18
(6)
◽
pp. 25-30
◽
1980 ◽
pp. 311-325
1999 ◽
Vol 62
(1)
◽
pp. 1-11
◽