A Compact Model and Parameter Extraction Method for a Staggered OFET With Power-Law Contact Resistance and Mobility

2019 ◽  
Vol 66 (11) ◽  
pp. 4894-4900 ◽  
Author(s):  
Sungyeop Jung ◽  
Jong Woo Jin ◽  
Vincent Mosser ◽  
Yvan Bonnassieux ◽  
Gilles Horowitz
Author(s):  
Minho Yoon ◽  
Jiyoul Lee

Abstract We present a device parameter extraction method that enables the reliable extraction of the intrinsic device parameters of zinc oxide (ZnO) thin-film transistors (TFTs). By assuming that mobility and contact resistance were modeled as gate bias-dependent power-laws, we derived a current–voltage relationship that decoupled from the contact resistance effect. In accordance with this derived relationship, we extracted the intrinsic mobility and contact resistance using the modified method, the values being consistent with the parameters extracted using the four-probe method.


2004 ◽  
Vol 27 (2) ◽  
pp. 119-123 ◽  
Author(s):  
Haiwen Liu ◽  
Xiaowei Sun ◽  
Zhengfan Li

A new and simple parameter-extraction method for the equivalent circuit of defected ground structure (DGS) is presented. Using this method, circuit simulation, based on the DGS equivalent-circuit model, show excellent agreements with the electromagnetic (EM) simulation. Further, our method is applied effectively to design a low-pass filter (LPF) with DGS. Comparison between simulation and measurement confirm the validity of the LPF configuration and design procedure. Simple structure and high power handling capability are obtained from the proposed LPF.


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