Dynamic reconfigurable field-programmable logic arrays (FPGAs) are receiving notable
attention because of their much shorter reconfiguration time as compared with
traditional FPGAs. The short reconfiguration time is vital to applications such as
reconfigurable computing and emulation. We show in this paper that testing and
diagnosis of the FPGA also can take advantage of its dynamic reconfigurability. We
first propose an efficient methodology for testing the interconnects of the FPGA, then
present several universal test and diagnosis approaches which cover all functional units
of the FPGA. Experimental results show that our approach significantly reduces the
testing time, without additional cost for diagnosis.