Impact of Leakage Currents on N-MOSFET Reliability in Pulsed RF Life Test for Radar Application

2020 ◽  
Author(s):  
M.A. Belaid ◽  
A. Almusallam
Keyword(s):  
Life Test ◽  
Leakage Currents ◽  
Pulsed Rf

scholarly journals S-band pulsed-RF operating life test on AlGaN/GaN HEMT devices for radar application

2019 ◽  
Vol 100-101 ◽  
pp. 113434 ◽  
Author(s):  
N. Moultif ◽  
O. Latry ◽  
M. Ndiaye ◽  
T. Neveu ◽  
E. Joubert ◽  
...  
Keyword(s):  
Life Test ◽  
Operating Life ◽  
Gan Hemt ◽  
Pulsed Rf

Physical analysis of Schottky contact on power AlGaN/GaN HEMT after pulsed-RF life test

2012 ◽  
Vol 52 (9-10) ◽  
pp. 2205-2209 ◽  
Author(s):  
J.-B. Fonder ◽  
L. Chevalier ◽  
C. Genevois ◽  
O. Latry ◽  
C. Duperrier ◽  
...  
Keyword(s):  
Schottky Contact ◽  
Physical Analysis ◽  
Life Test ◽  
Gan Hemt ◽  
Pulsed Rf

scholarly journals RF performance reliability of power N-LDMOS under pulsed-RF aging life test in radar application S-band

2020 ◽  
Vol 14 (6) ◽  
pp. 805-810
Author(s):  
Mohamed Ali Belaïd ◽  
Ahmed Almusallam ◽  
Mohamed Masmoudi
Keyword(s):  
Life Test ◽  
Rf Performance ◽  
Pulsed Rf

Performance drifts of N-MOSFETs under pulsed RF life test

2014 ◽  
Vol 54 (9-10) ◽  
pp. 1851-1855 ◽  
Author(s):  
M.A. Belaïd ◽  
M. Gares ◽  
K. Daoud ◽  
O. Latry
Keyword(s):  
Life Test ◽  
Pulsed Rf

Study on the Analysis of Failure Cause and Determination of Life Test Mode of Capsule

2018 ◽  
Vol 18 (3) ◽  
pp. 260-270
Author(s):  
Bosik Kang ◽  
Yongbum Lee ◽  
Dongsoo Jung ◽  
Chungsung Lee
Keyword(s):  
Life Test ◽  
Test Mode

Results from Life Test in Progress on Eagle-Picher Nickel Cadmium Cells

1987 ◽  
Author(s):  
C. C. Badcock ◽  
S. W. Donley ◽  
W. C. Hwang ◽  
J. J. Matsumoto ◽  
T, M. Poston ◽  
...  
Keyword(s):  
Life Test ◽  
Nickel Cadmium
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