Multi-Resolution Aitchison Geometry Image Denoising for Low-Light Photography

2021 ◽  
pp. 1-1
Author(s):  
Sarah Miller ◽  
Chen Zhang ◽  
Keigo Hirakawa
Keyword(s):  
Image Denoising ◽  
Aitchison Geometry ◽  
Low Light ◽  
Geometry Image

scholarly journals A Novel Approach of Low-Light Image Denoising for Face Recognition

2014 ◽  
Vol 6 ◽  
pp. 256790
Author(s):  
Yimei Kang ◽  
Wang Pan
Keyword(s):  
Face Recognition ◽  
Image Denoising ◽  
Recognition Rate ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Face Database ◽  
Low Light ◽  
Very Low Frequency ◽  
Light Image

Illumination variation makes automatic face recognition a challenging task, especially in low light environments. A very simple and efficient novel low-light image denoising of low frequency noise (DeLFN) is proposed. The noise frequency distribution of low-light images is presented based on massive experimental results. The low and very low frequency noise are dominant in low light conditions. DeLFN is a three-level image denoising method. The first level denoises mixed noises by histogram equalization (HE) to improve overall contrast. The second level denoises low frequency noise by logarithmic transformation (LOG) to enhance the image detail. The third level denoises residual very low frequency noise by high-pass filtering to recover more features of the true images. The PCA (Principal Component Analysis) recognition method is applied to test recognition rate of the preprocessed face images with DeLFN. DeLFN are compared with several representative illumination preprocessing methods on the Yale Face Database B, the Extended Yale face database B, and the CMU PIE face database, respectively. DeLFN not only outperformed other algorithms in improving visual quality and face recognition rate, but also is simpler and computationally efficient for real time applications.

Low light image denoising solution with contrast enhancement in curvelet domain using Gaussian mixture adaptation model

2020 ◽  
pp. 2050054
Author(s):  
K. Sreekala ◽  
H. C. Sateesh Kumar ◽  
K. B. Raja
Keyword(s):  
Em Algorithm ◽  
Contrast Enhancement ◽  
Image Denoising ◽  
Structural Information ◽  
Similarity Index ◽  
Curvelet Transform ◽  
Gaussian Mixture ◽  
Low Light ◽  
Data Set ◽  
Light Image

Images captured under low light are noisy and consist of unidentifiable features. Low light noise problem occurs in imaging devices because of smaller sensor size or insufficient exposure. Low light image denoising is an exacting task in many image processing applications. This paper proposes a patch-based image denoising method for low light images in the curvelet domain with contrast enhancement. Curvelet transform is a directional transform and it gives the best sparse representation for images with edges. Here the Expectation–Maximization (EM) algorithm, based on the Gaussian mixture adaptation method is performed in the curvelet domain for denoising. EM Algorithm helps in computing the Gaussian mixture model (GMM) parameters from the patches which are used in maximum a posteriori estimation to update them. GMM parameters and patches are updated periodically until a satisfactory result is achieved. Simulation is performed on standard test data set, and then extended to natural low light noisy images. The results of the proposed technique are then compared using quality metrics such as Peak Signal to Noise Ratio and Structural Similarity Index. It is observed that the use of curvelet transform in denoising process helps to restore the structural information satisfactorily.

Software pattern recognition applied to nanodiffraction patterns from a STEM instrument

1986 ◽  
Vol 44 ◽  
pp. 694-695
Author(s):  
G.Y. Fan ◽  
J.M. Cowley
Keyword(s):  
Image Processing ◽  
Pattern Recognition ◽  
Computer Software ◽  
Processing System ◽  
Light Level ◽  
Host Computer ◽  
Low Light ◽  
Image Processing System ◽  
Recent Developments ◽  
On Line

In recent developments, the ASU HB5 has been modified so that the timing, positioning, and scanning of the finely focused electron probe can be entirely controlled by a host computer. This made the asynchronized handshake possible between the HB5 STEM and the image processing system which consists of host computer (PDP 11/34), DeAnza image processor (IP 5000) which is interfaced with a low-light level TV camera, array processor (AP 400) and various peripheral devices. This greatly facilitates the pattern recognition technique initiated by Monosmith and Cowley. Software called NANHB5 is under development which, instead of employing a set of photo-diodes to detect strong spots on a TV screen, uses various software techniques including on-line fast Fourier transform (FFT) to recognize patterns of greater complexity, taking advantage of the sophistication of our image processing system and the flexibility of computer software.

Low-light-level three-dimensional video microscope with long working distance objective lenses

1994 ◽  
Vol 52 ◽  
pp. 226-227
Author(s):  
W. Lin ◽  
J. Gregorio ◽  
T.J. Holmes ◽  
D. H. Szarowski ◽  
J.N. Turner
Keyword(s):  
Three Dimensional ◽  
Light Level ◽  
Stereo Pair ◽  
Light Illumination ◽  
Initial Image ◽  
Low Light ◽  
Image Recording ◽  
Depth Discrimination ◽  
Video Microscope ◽  
Working Distance

A low-light level video microscope with long working distance objective lenses has been built as part of our integrated three-dimensional (3-D) light microscopy workstation (Fig. 1). It allows the observation of living specimens under sufficiently low light illumination that no significant photobleaching or alternation of specimen physiology is produced. The improved image quality, depth discrimination and 3-D reconstruction provides a versatile intermediate resolution system that replaces the commonly used dissection microscope for initial image recording and positioning of microelectrodes for neurobiology. A 3-D image is displayed on-line to guide the execution of complex experiments. An image composed of 40 optical sections requires 7 minutes to process and display a stereo pair.The low-light level video microscope utilizes long working distance objective lenses from Mitutoyo (10X, 0.28NA, 37 mm working distance; 20X, 0.42NA, 20 mm working distance; 50X, 0.42NA, 20 mm working distance). They provide enough working distance to allow the placement of microelectrodes in the specimen.

Sign in / Sign up

Export Citation Format

Share Document