scholarly journals New family of single-error correcting codes

1970 ◽  
Vol 16 (6) ◽  
pp. 717-719 ◽  
Author(s):  
N. Sloane ◽  
D. Whitehead
Electronics ◽  
2020 ◽  
Vol 9 (5) ◽  
pp. 709
Author(s):  
Abhishek Das ◽  
Nur A. Touba

Technology scaling has led to an increase in density and capacity of on-chip caches. This has enabled higher throughput by enabling more low latency memory transfers. With the reduction in size of SRAMs and development of emerging technologies, e.g., STT-MRAM, for on-chip cache memories, reliability of such memories becomes a major concern. Traditional error correcting codes, e.g., Hamming codes and orthogonal Latin square codes, either suffer from high decoding latency, which leads to lower overall throughput, or high memory overhead. In this paper, a new single error correcting code based on a shared majority voting logic is presented. The proposed codes trade off decoding latency in order to improve the memory overhead posed by orthogonal Latin square codes. A latency optimization technique is also proposed which lowers the decoding latency by incurring a slight memory overhead. It is shown that the proposed codes achieve better redundancy compared to orthogonal Latin square codes. The proposed codes are also shown to achieve lower decoding latency compared to Hamming codes. Thus, the proposed codes achieve a balanced trade-off between memory overhead and decoding latency, which makes them highly suitable for on-chip cache memories which have stringent throughput and memory overhead constraints.


2006 ◽  
Vol 42 (1) ◽  
pp. 67-72 ◽  
Author(s):  
Simon Litsyn ◽  
Beniamin Mounits

1996 ◽  
Vol 42 (4) ◽  
pp. 1261-1262 ◽  
Author(s):  
P.R.J. Ostergard ◽  
M.K. Kaikkonen

2008 ◽  
Vol 17 (05) ◽  
pp. 773-783 ◽  
Author(s):  
HEESUNG LEE ◽  
EUNTAI KIM

Error correcting codes (ECCs) are commonly used as a protection against the soft errors. Single error correcting and double error detecting (SEC–DED) codes are generally used for this purpose. Such circuits are widely used in industry in all types of memory, including caches and embedded memory. In this paper, a new genetic design for ECC is proposed to perform SEC–DED in the memory check circuit. The design is aimed at finding the implementation of ECC which consumes minimal power. We formulate the ECC design into a permutable optimization problem and employ special genetic operators appropriate for this formulation. Experiments are performed to demonstrate the performance of the proposed method.


1974 ◽  
Vol 10 (19) ◽  
pp. 408
Author(s):  
P.G. Farrell ◽  
Z. Al-Bandar

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